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A.M.Y. Ibrahim MSc (Ahmed)

Onderzoeker

Expertises

System-On-Chip
Managers
Redundancy
Built-In Self Test
Costs
Engines
Testing
Communication

Publicaties

Recente Artikelen
Ibrahim, A. M. Y., & Kerkhoff, H. G. (2017). Structured Scan Patterns Retargeting for Dynamic Instruments Access. 1-6. Paper presented at 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, United States.DOI: 10.1109/VTS.2017.7928955
Ibrahim, A. M. Y., & Kerkhoff, H. G. (2016). Efficient Utilization of Hierarchical iJTAG Networks for Interrupts Management. In 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (pp. 97-102). USA: IEEE Computer Society. DOI: 10.1109/DFT.2016.7684077
Ibrahim, A. M. Y., & Kerkhoff, H. G. (2016). Analysis and design of an on-chip retargeting engine for IEEE 1687 networks. In 21st IEEE European Test Symposium (ETS 2016) (pp. 1-6). USA: IEEE Circuits & Systems Society. DOI: 10.1109/ETS.2016.7519301
Ibrahim, A. M. Y., & Kerkhoff, H. G. (2016). Towards an automated and reusable in-field self-test solution for MPSoCs. In 28th International Conference on Microelectronics (ICM 2016) (pp. 249-252). USA: IEEE Computer Society. DOI: 10.1109/ICM.2016.7847862
Ibrahim, A. M. Y., & Kerkhoff, H. G. (2015). A system level approach for a dependable heterogeneous MPSoC. In Supplemental Proceeding of The 45th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (pp. 141082). Rio de Janeiro: Sociedade Brasileira de ComputaƧao - SBC.
Ibrahim, A. M. Y., & Kerkhoff, H. G. (2014). iJTAG integration of complex digital embedded instruments. In 9th International Design & Test Symposium, IDT 2014 (pp. 18-23). USA: IEEE Computer Society. DOI: 10.1109/IDT.2014.7038580

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Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Zilverling (gebouwnr. 11), kamer 5034
Hallenweg 19
7522NH  Enschede

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Postadres

Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Zilverling  5034
Postbus 217
7500 AE Enschede