Expertises
Physics & Astronomy
# Energy
# Grazing Incidence
# Ion Scattering
# Ions
# Laminates
# Reflectance
# Transition Metals
# X Rays
Publicaties
Recent
Phadke, P.
, Zameshin, A. A.
, Sturm, J. M.
, van de Kruijs, R. W. E.
, & Bijkerk, F. (2022).
Sputter yields of monoatomic solids by Ar and Ne ions near the threshold: A Bayesian analysis of the Yamamura Model.
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms,
520, 29-39.
https://doi.org/10.1016/j.nimb.2022.03.016
Zameshin, A. A.
, Medvedev, R. V.
, Yakshin, A. E.
, & Bijkerk, F. (2021).
Interface formation in W/Si multilayers studied by Low Energy Ion Scattering.
Thin solid films,
724, [138569].
https://doi.org/10.1016/j.tsf.2021.138569
Medvedev, R.
, Zameshin, A.
, Sturm, J. M.
, Yakshin, A.
, & Bijkerk, F. (2020).
W/B short period multilayer structures for soft x-rays.
AIP advances,
10(4), [045305].
https://doi.org/10.1063/1.5143397
Stilhano Vilas Boas, C. R.
, Zameshin, A.
, Sturm, J. M.
, & Bijkerk, F. (2019).
Matrix effect in transition metal oxide formation: neutralization by O 2s levels. Poster session presented at Low Energy Ion Scattering workshop 2019, Enschede, Netherlands.
Zameshin, A. (2019).
Angular and spectral bandwidth of XUV multilayers near spacer material absorption edges. Poster session presented at Physics@Veldhoven 2019, Veldhoven, Netherlands.
Chandrasekaran, A.
, van de Kruijs, R. W. E.
, Sturm, J. M.
, Zameshin, A.
, & Bijkerk, F. (2019).
Nanoscale Transition Metal Thin Films: Growth Characteristics and Scaling Law for Interlayer Formation.
ACS applied materials & interfaces,
11(49), 46311−46326.
https://doi.org/10.1021/acsami.9b14414
Reinink, J.
, Zameshin, A.
, van de Kruijs, R. W. E.
, & Bijkerk, F. (2019).
In-situ studies of silicide formation during growth of molybdenum-silicon interfaces.
Journal of Applied Physics,
126(13), [135304].
https://doi.org/10.1063/1.5092876
Medvedev, R. V.
, Nikolaev, K. V.
, Zameshin, A. A.
, Ijpes, D.
, Makhotkin, I. A., Yakunin, S. N.
, Yakshin, A. E.
, & Bijkerk, F. (2019).
Low-energy ion polishing of Si in W/Si soft X-ray multilayer structures.
Journal of Applied Physics,
126(4), [045302].
https://doi.org/10.1063/1.5097378
Zameshin, A.
, Yakshin, A.
, Chandrasekaran, A.
, & Bijkerk, F. (2019).
Angular and spectral bandwidth of Extreme UV multilayers near spacer material absorption edges.
Journal of nanoscience and nanotechnology,
19(1), 602-608.
https://doi.org/10.1166/jnn.2019.16478
Contactgegevens
Bezoekadres
Universiteit Twente
Drienerlolaan 5
7522 NB Enschede
Postadres
Universiteit Twente
Postbus 217
7500 AE Enschede