Expertises
Multilayer
Annealing
Grazing Incidence
Reflectance
Annealing
X Rays
Laminates
X-Rays
Reflectivity
Incidence
Ion Scattering
Incidence
Energy
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Publicaties
Recent
Zameshin, A. A., Yakshin, A. E., Sturm, J. M., Brongerma, H. H., & Bijkerk, F. (2018). Double matrix effect in Low Energy Ion Scattering from La surfaces. Applied surface science, 440, 570-579. DOI: 10.1016/j.apsusc.2018.01.174
Zameshin, A., Makhotkin, I. A., Yakunin, S. N., van de Kruijs, R. W. E., Yakshin, A., & Bijkerk, F. (2016). Reconstruction of interfaces of periodic multilayers from X-ray reflectivity using a free-form approach. Journal of applied crystallography, 49(4), 1300-1307. DOI: 10.1107/S160057671601044X
Zameshin, A., Yakshin, A., Sturm, J. M., Brongersma, H. H., & Bijkerk, F. (2016). Low Energy Ion Scattering from La surfaces. -.
Makhotkin, I. A., Zameshin, A., van de Kruijs, R. W. E., Yakshin, A., & Bijkerk, F. (2015). Characterization of nanoscale multilayer structures upon thermal annealing. Proceedings of SPIE - the international society for optical engineering, 9510(95100V), -. [95100V]. DOI: 10.1117/12.2182256
Zameshin, A., Makhotkin, I. A., Yakunin, S. N., van de Kruijs, R. W. E., Yakshin, A., & Bijkerk, F. (2015). Electron density profile determination for multilayers. -. Poster session presented at Physics@FOM Veldhoven 2015, Veldhoven, Netherlands.
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Universiteit Twente
Faculteit Technische Natuurwetenschappen
Carré
(gebouwnr. 15), kamer C2013
Hallenweg 23
7522NH Enschede
Postadres
Universiteit Twente
Faculteit Technische Natuurwetenschappen
Carré
C2013
Postbus 217
7500 AE Enschede