Expertises
Chemistry
# Mid-Ir Spectroscopy
# Refractive Index
# Sputtering Target
Engineering & Materials Science
# Aluminum Oxide
# Atomic Force Microscopy
# Oxidation
# Pulsed Laser Deposition
Physics & Astronomy
# Pulsed Laser Deposition
Verbonden aan
Publicaties
Recent
van Emmerik, C. I.
, Hendriks, W. A. P. M.
, Stok, M. L.
, de Goede, M.
, Chang, L.
, Dijkstra, M.
, Segerink, F.
, Post, D.
, Keim, E. G.
, Dikkers, M. J.
, & García-Blanco, S. M. (2020).
Relative oxidation state of the target as guideline for depositing optical quality RF reactive magnetron sputtered Al2O3 layers.
Optical materials express,
10(6), 1451-1462.
https://doi.org/10.1364/OME.393058
Wessels, W. A.
, Bollmann, T. R. J.
, Post, D.
, Koster, G.
, & Rijnders, G. (2017).
Imaging Pulsed Laser Deposition oxide growth by in-situ Atomic Force Microscopy.
Review of scientific instruments,
88(12), [123902 ].
https://doi.org/10.1063/1.5004567
Wessels, W. A.
, Bollmann, T. R. J.
, Post, D.
, Koster, G.
, & Rijnders, A. J. H. M. (2017).
Imaging Pulsed Laser Deposition oxide growth by in-situ Atomic Force Microscopy. Poster session presented at Dutch SPM Day 2017, Leiden, Netherlands.
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Bezoekadres
Universiteit Twente
Faculty of Science and Technology
Carré
(gebouwnr. 15), kamer C3221
Hallenweg 23
7522NH Enschede
Postadres
Universiteit Twente
Faculty of Science and Technology
Carré
C3221
Postbus 217
7500 AE Enschede