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H.A.G.M. van Wolferen (Henk)

Technicus voor Focused Ion Beam en BioNanoLab

Expertises

Scanning Electron Microscopy
Scanning Electron Microscopy
Experiments
Experiments
Microscopes
Microscopes
Pulses
Ruthenium
Ablation
Free Electron Lasers
Dimers
Electron Beams
Illumination
Scanning Electron Microscopy
Electron Microscopes
Nanostructures
Quantitative Analysis
Chemical Analysis
Dimers
Nanoparticles
Nanoparticles
Nanoparticles
Focused Ion Beams
Raman Spectroscopy
Electron Microscopy
Microscopic Examination
Electron Microscopes
Nanoparticle
Focused Ion Beams
Resonators
Microscopic Examination
Raman Spectroscopy
Resonators
Whispering Gallery Modes
Chemical Analysis
Magnetic Disks
Distributed Feedback Lasers
Pumps
Silicon

Publicaties

Recent
Milov, I., Makhotkin, I. A., Enkisch, H., Sobierajski, R., Chalupsky, J., Tiedtke, K., ... Bijkerk, F. (2016). Single-shot damage of Ru thin film induced by FEL fs pulses. -. Poster session presented at Physics of X-Ray and Neutron Multilayer Structures workshop 2016, Enschede, Netherlands.
Milov, I., Makhotkin, I. A., Enkisch, H., Sobierajski, R., Chalupsky, J., Tiedtke, K., ... Bijkerk, F. (2016). Single-shot damage of Ru thin film induced by FEL fs pulses. -.

Pure Link

Contactgegevens

Bezoekadres

Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Nanolab (gebouwnr. 16), kamer 1050
Hallenweg 23
7522NH  Enschede

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Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Horst Complex (gebouwnr. 20), kamer ZH152
De Horst 2
7522LW  Enschede

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Postadres

Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Horst Complex  ZH152
Postbus 217
7500 AE Enschede