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dr.ir. H.G. Kerkhoff (Hans)

Universitair hoofddocent

Expertises

Testing
Defects
System-On-Chip
Sensors
Fluidics
Hardware
Monitoring
Digital To Analog Conversion

Publicaties

Recente Artikelen
Ibrahim, A. M. Y., & Kerkhoff, H. G. (2017). Structured Scan Patterns Retargeting for Dynamic Instruments Access. 1-6. Paper presented at 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, United States.DOI: 10.1109/VTS.2017.7928955
Ali, G., Badawy, A., & Kerkhoff, H. G. (2016). Accessing on-chip temperature health monitors using the IEEE 1687 standard. 776-779. Paper presented at 23rd IEEE International Conference on Electronics, Circuits and Systems (ICECS), .DOI: 10.1109/ICECS.2016.7841317
Ibrahim, A. M. Y., & Kerkhoff, H. G. (2016). Efficient Utilization of Hierarchical iJTAG Networks for Interrupts Management. In 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (pp. 97-102). USA: IEEE Computer Society. DOI: 10.1109/DFT.2016.7684077
Alt, J., Bernardi, P., Bosio, A., Cantoro, R., Kerkhoff, H. G., Leininger, A., ... Strasser, S. (2016). Thermal issues in test: An overview of the significant aspects and industrial practice. In IEEE 34th VLSI Test Symposium (VTS 2016) (pp. 1-4). USA: IEEE. DOI: 10.1109/VTS.2016.7477278
Ebrahimi, H., & Kerkhoff, H. G. (2016). Testing for intermittent resistive faults in CMOS integrated systems. In IEEE 2016 Euromicro Conference on Digital System Design (DSD) (pp. 703-707). USA: IEEE Circuits & Systems Society. DOI: 10.1109/DSD.2016.58
Zambrano Constantini, A. C., & Kerkhoff, H. G. (2016). Online monitoring of the maximum angle error in AMR sensors. In IEEE 22st International On-Line Testing Symposium, IOLTS 2016 (pp. -). USA: IEEE. DOI: 10.1109/IOLTS.2016.7604703
Ibrahim, A. M. Y., & Kerkhoff, H. G. (2016). Analysis and design of an on-chip retargeting engine for IEEE 1687 networks. In 21st IEEE European Test Symposium (ETS 2016) (pp. 1-6). USA: IEEE Circuits & Systems Society. DOI: 10.1109/ETS.2016.7519301
Zambrano Constantini, A. C., & Kerkhoff, H. G. (2016). Determination of the drift of the maximum angle error in AMR sensors due to aging. In 2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) (pp. 92-96). usa: IEEE. DOI: 10.1109/IMS3TW.2016.7524234

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Bezoekadres

Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Zilverling (gebouwnr. 11), kamer 5078
Hallenweg 19
7522NH  Enschede

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Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Zilverling  5078
Postbus 217
7500 AE Enschede