Welkom...

dr.ir. H.G. Kerkhoff (Hans)

Universitair hoofddocent

Expertises

Testing
Sensors
Defects
System-On-Chip
Fluidics
Digital To Analog Conversion
Hardware
Monitoring

Publicaties

Recent
Ibrahim, A. M. Y., & Kerkhoff, H. G. (2017). A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. In 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) (pp. 1-2). IEEE. DOI: 10.1109/IOLTS.2017.8046166
Rohani, A., Ebrahimi, H., & Kerkhoff, H. G. (2016). A software framework to calculate local temperatures in CMOS processors. 183-188. Paper presented at 26th International Workshop on Power and Timing Modeling, Optimization and Simulation, Bremen, Germany.DOI: 10.1109/PATMOS.2016.7833685
Ibrahim, A. M. Y., & Kerkhoff, H. G. (2016). Efficient Utilization of Hierarchical iJTAG Networks for Interrupts Management. In 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (pp. 97-102). USA: IEEE Computer Society. DOI: 10.1109/DFT.2016.7684077
Alt, J., Bernardi, P., Bosio, A., Cantoro, R., Kerkhoff, H. G., Leininger, A., ... Strasser, S. (2016). Thermal issues in test: An overview of the significant aspects and industrial practice. In IEEE 34th VLSI Test Symposium (VTS 2016) (pp. 1-4). USA: IEEE. DOI: 10.1109/VTS.2016.7477278
Ebrahimi, H., & Kerkhoff, H. G. (2016). Testing for intermittent resistive faults in CMOS integrated systems. In IEEE 2016 Euromicro Conference on Digital System Design (DSD) (pp. 703-707). USA: IEEE Circuits & Systems Society. DOI: 10.1109/DSD.2016.58

Pure Link

Contactgegevens

Bezoekadres

Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Zilverling (gebouwnr. 11), kamer 5078
Hallenweg 19
7522NH  Enschede

Navigeer naar locatie

Postadres

Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Zilverling  5078
Postbus 217
7500 AE Enschede