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dr.ir. H.G. Kerkhoff (Hans)

Expertises

Engineering & Materials Science
Aging Of Materials
Cyber Physical System
Fault Detection
Ieee Standards
Monitoring
Network-On-Chip
System-On-Chip
Mathematics
System-On-Chip

Publicaties

Recent
Ebrahimi, H. , & Kerkhoff, H. G. (2020). A New Monitor Insertion Algorithm for Intermittent Fault Detection. In 2020 IEEE European Test Symposium, ETS 2020 [9131563] (Proceedings of the European Test Workshop; Vol. 2020-May). IEEE. https://doi.org/10.1109/ETS48528.2020.9131563
Ali, G. , Bagheriye, L., Manhaeve, H. , & Kerkhoff, H. G. (2020). On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs. In IEEE Asian Test Symposium, ATS 2020 (IEEE Asian Test Symposium (ATS); Vol. 2020, No. 29). IEEE. https://doi.org/10.1109/ATS49688.2020.9301509
Bagheriye, L. , Ali, G. , & Kerkhoff, H. G. (2020). Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning. In IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2020 (pp. 1-4). (IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS); Vol. 2020, No. 26). IEEE. https://doi.org/10.1109/IOLTS50870.2020.9159753
Ali, G. , Bagheriye, L. , & Kerkhoff, H. G. (2020). On-Chip Embedded Instruments Data Fusion and Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning. In IEEE International Symposium on Circuits and Systems, ISCAS 2020 (pp. 1-5). (IEEE International Symposium on Circuits and Systems (ISCAS); Vol. 2020). IEEE. https://doi.org/10.1109/ISCAS45731.2020.9180773
Ibrahim, A. M. Y. , & Kerkhoff, H. G. (2019). DARS: An EDA framework for reliability and functional safety management of system-on-chips. In 2019 IEEE International Test Conference, ITC 2019 [9000112] (Proceedings - International Test Conference; Vol. 2019-November). IEEE. https://doi.org/10.1109/ITC44170.2019.9000112
Pathrose, J., Van De Logt, L. , & Kerkhoff, H. G. (2019). Analog test interface for IEEE 1687 employing split SAR architecture to support embedded instrument dependability applications. In 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019 [8875372] IEEE. https://doi.org/10.1109/DFT.2019.8875372

Contactgegevens

+31622563782(mobiel)
+31534893633 (secretaresse)
+31534893633 (bij geen gehoor)
 

Bezoekadres

Universiteit Twente
Drienerlolaan 5
7522 NB Enschede

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Postadres

Universiteit Twente
Postbus 217
7500 AE Enschede