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dr.ir. H.G. Kerkhoff (Hans)

Universitair hoofddocent

Expertises

System-On-Chip
Defects
Defects
Avionics
Networks (Circuits)
Costs
Niobium
Monitoring
Aging Of Materials

Publicaties

Recent
Kerkhoff, H. G., Ali, G., Wan, J., Ibrahim, A. M. Y., & Pathrose Vareed, J. (2017). Applying IJTAG-compatible embedded instruments for lifetime enhancement of analog front-ends of cyber-physical systems. 1-6. Paper presented at 25th IFIP/IEEE International Conference on Very Large Scale Intergration 2017, Abu Dhabi, United Arab Emirates.DOI: 10.1109/VLSI-SoC.2017.8203464
Ibrahim, A. M. Y., & Kerkhoff, H. G. (2017). A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. In 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) (pp. 1-2). IEEE. DOI: 10.1109/IOLTS.2017.8046166
Rohani, A., Ebrahimi, H., & Kerkhoff, H. G. (2016). A software framework to calculate local temperatures in CMOS processors. 183-188. Paper presented at 26th International Workshop on Power and Timing Modeling, Optimization and Simulation, Bremen, Germany.DOI: 10.1109/PATMOS.2016.7833685

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Contactgegevens

Bezoekadres

Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Zilverling (gebouwnr. 11), kamer 5078
Hallenweg 19
7522NH  Enschede

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Postadres

Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Zilverling  5078
Postbus 217
7500 AE Enschede