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Ibrahim, A. M. Y. , & Kerkhoff, H. G. (2019). DARS: An EDA framework for reliability and functional safety management of system-on-chips. In 2019 IEEE International Test Conference, ITC 2019 Article 9000112 (Proceedings - International Test Conference; Vol. 2019-November). IEEE. https://doi.org/10.1109/ITC44170.2019.9000112

Pathrose, J., Van De Logt, L. , & Kerkhoff, H. G. (2019). Analog test interface for IEEE 1687 employing split SAR architecture to support embedded instrument dependability applications. In 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019 Article 8875372 IEEE. https://doi.org/10.1109/DFT.2019.8875372

Zhao, Y. (2019). Health monitoring and life-time prognostics to enable dependable many-processor S0Cs. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente. https://doi.org/10.3990/1.9789036549165

Ibrahim, A. M. Y. , & Kerkhoff, H. G. (2019). An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips. In 2019 IEEE International Test Conference in Asia (ITC-Asia) (pp. 109-114). Article 8871531 IEEE. https://doi.org/10.1109/ITC-Asia.2019.00032