Expertises
Engineering & Materials Science
# Avalanche Diodes
# Boron
# Chemical Vapor Deposition
# Diodes
# Doping (Additives)
# Photodiodes
# Silicon
Chemistry
# Boron Atom
Verbonden aan
Publicaties
Recent
Nanver, L. K., Hassan, V. V., Attariabad, A., Rosson, N., & Arena, C. J. (Accepted/In press).
Broadband PureB Ge-on-Si photodiodes.
IEEE electron device letters.
https://doi.org/10.1109/LED.2024.3391729
Knezevic, T.
, & Nanver, L. K. (2023).
Identifying nano-Schottky diode currents in silicon diodes with 2D interfacial layers. In
2023 35th International Conference on Microelectronic Test Structure (ICMTS) (IEEE International Conference on Microelectronic Test Structures; Vol. 2023-March). IEEE.
https://doi.org/10.1109/ICMTS55420.2023.10094164
Nanver, L., & Kneževic, T. (2022).
Optical detectors. In A. Chen (Ed.),
Advances in Semiconductor Technologies: Selected Topics Beyond Conventional CMOS (pp. 211-229). Wiley-Blackwell.
https://doi.org/10.1002/9781119869610.ch11
Van Zoeren, J.
, & Nanver, L. K. (2022).
Checks on temperature during on-wafer I-V characterization of Si diodes made with 2-D interfacial layers. In
2022 IEEE 34th International Conference on Microelectronic Test Structures, ICMTS 2022 - Proceedings (pp. 149-154). IEEE.
https://doi.org/10.1109/ICMTS50340.2022.9898239
Markovic, L., Knezevic, T.
, Nanver, L. K., & Suligoj, T. (2021).
Modeling and Simulation Study of Electrical Properties of Ge-on-Si Diodes with Nanometer-thin PureGaB Layer. In M. Koricic, K. Skala, Z. Car, M. Cicin-Sain, S. Babic, V. Sruk, D. Skvorc, S. Ribaric, B. Jerbic, S. Gros, B. Vrdoljak, M. Mauher, E. Tijan, T. Katulic, J. Petrovic, T. G. Grbac, N. F. Fijan, & V. Gradisnik (Eds.),
2021 44th International Convention on Information, Communication and Electronic Technology, MIPRO 2021 - Proceedings (pp. 64-69). IEEE.
https://doi.org/10.23919/MIPRO52101.2021.9597002
Nanver, L. K., Knežević, T.
, Liu, X.
, D. Thammaiah, S.
, & Krakers, M. (2021).
On the Many Applications of Nanometer-Thin Pure Boron Layers in IC and Microelectromechanical Systems Technology.
Journal of nanoscience and nanotechnology,
21(4), 2472-2482.
https://doi.org/10.1166/jnn.2021.19112
Krakers, M., Knežević, T.
, & Nanver, L. K. (2021).
Optoelectrical Operation Stability of Broadband PureGaB Ge-on-Si Photodiodes with Anomalous Al-Mediated Sidewall Contacting.
Journal of electronic materials,
50(12), 7026-7036.
https://doi.org/10.1007/s11664-021-09233-8
Liu, X. (2021).
Low temperature pure boron layer deposition for silicon diode and micromachining applications. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente.
https://doi.org/10.3990/1.9789036552547
Nanver, L. K., Qi, L.
, Liu, X., & Knežević, T. (2021).
Nanolayer boron-semiconductor interfaces and their device applications.
Solid-state electronics,
186, Article 108041.
https://doi.org/10.1016/j.sse.2021.108041
Knezevic, T., Suligoj, T., Capan, I.
, & Nanver, L. K. (2021).
Low-Temperature Electrical Performance of PureB Photodiodes Revealing Al-Metallization-Related Degradation of Dark Currents.
IEEE Transactions on Electron Devices,
68(6), 2810 - 2817.
https://doi.org/10.1109/TED.2021.3074117
Pure Link
Vakken Collegejaar 2023/2024
Vakken in het huidig collegejaar worden toegevoegd op het moment dat zij definitief zijn in het Osiris systeem. Daarom kan het zijn dat de lijst nog niet compleet is voor het gehele collegejaar.
Vakken Collegejaar 2022/2023
Contactgegevens
Bezoekadres
Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré
(gebouwnr. 15), kamer C2639
Hallenweg 21
7522NH Enschede
Postadres
Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré
C2639
Postbus 217
7500 AE Enschede