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S. Banerjee MSc (Sourish)

Expertises

Gallium
Ammonia
Gallium Nitrides
Pulses
Heterojunctions
Diodes
Electroluminescence
Charge Carriers
Diodes
Continuity
Wire
Silicon
Diodes
Silicon
Spectroscopic Ellipsometry
Conduction

Publicaties

Recent
Banerjee, S., van der Velde, F. J., Yang, M., Schmitz, J., & Kovalgin, A. Y. (2017). Electrical test structures for verifying continuity of ultra-thin insulating and conducting films. In Electrical test structures for verifying continuity of ultra-thin insulating and conducting films (pp. 1-6). New York: IEEE. DOI: 10.1109/ICMTS.2017.7954258

Contactgegevens

Bezoekadres

Universiteit Twente
Drienerlolaan 5
7522 NB Enschede

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Postadres

Universiteit Twente
Postbus 217
7500 AE Enschede

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