Welkom...

prof.dr.ir. A. Stein (Alfred)

Hoogleraar

Expertises

Method
Parameter
Modeling
Remote Sensing
Pixel
Uncertainty
Shoreline
Detection
Artificial Neural Network

Nevenactiviteiten

  • UCT
    Honorary professorship
  • Pretoria University
    Honorary professorship
  • ME commissie
    MER commissie Waddenzee
  • Various publishers
    Editorial board memberships
  • Elsevier
    Editor in chief Spatial Statistics
  • Elsevier
    Organizing the next Spatial Statistics conference in Castellon

Publicaties

Recent
Araujo Navas, A. L., Soares Magalhães, R. J., Osei, F., Fornillos, R. J. C., Leonardo, L. R., & Stein, A. (2018). Modelling local areas of exposure to Schistosoma japonicum in a limited survey data environment. Parasites & vectors, 11(1), 1-15. [465]. DOI: 10.1186/s13071-018-3039-6
Byju, A. P., Kumar, A., Stein, A., & Kumar, A. S. (2018). Combining the FCM Classifier with Various Kernels to Handle Non-linearity of Class Boundaries. Photonirvachak = Journal of the Indian society of remote sensing. DOI: 10.1007/s12524-018-0813-z

Pure Link

Contactgegevens

Bezoekadres

Universiteit Twente
Faculteit Geo-Informatie Wetenschappen en Aardobservatie
ITC (gebouwnr. 75), kamer 2-048
Hengelosestraat 99
7514AE  Enschede

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Postadres

Universiteit Twente
Faculteit Geo-Informatie Wetenschappen en Aardobservatie
ITC  2-048
Postbus 217
7500 AE Enschede

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