Publicaties
2024
Examining the influence of W thickness on the Si-on-W Interface: A comparative metrology analysis (2024)Applied surface science, 670. Article 160615. Valpreda, A., Sturm, J. M., Yakshin, A. E., Woitok, J. F., Lokhorst, H. W., Phadke, P. & Ackermann, M.https://doi.org/10.1016/j.apsusc.2024.160615The effect of W thickness on the interface Si-on-W, a Low-Energy Ion Scattering study (2024)[Contribution to conference › Poster] NWO Physics 2024. Valpreda, A., Sturm, J. M., Yakshin, A. E. & Ackermann, M.
2023
Resolving buried interfaces by Low-Energy Ion Scattering (2023)[Contribution to conference › Poster] International Conference on Physics of X-Ray and Neutron Multilayer Structures, PXRNMS 2023. Valpreda, A.Resolving buried interfaces with low energy ion scattering (2023)Journal of vacuum science & technology A: vacuum, surfaces, and films, 41(4). Article 043203. Valpreda, A., Sturm, J. M., Yakshin, A. E. & Ackermann, M.https://doi.org/10.1116/6.0002567
2022
Simulation of LEIS spectra: use of a Monte Carlo code to calculate reionization (2022)[Contribution to conference › Poster] Physics@Veldhoven 2022. Valpreda, A., Zameshin, A., Sturm, J. M., Yakshin, A. & Ackermann, M.
Onderzoeksprofielen
Adres
Universiteit Twente
Carré (gebouwnr. 15), kamer 2.013
Hallenweg 23
7522 NH Enschede
Universiteit Twente
Carré 2.013
Postbus 217
7500 AE Enschede
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