Expertises
Material Science
- Reflectivity
- Surface
- Temperature
- Thin Films
Chemistry
- Liquid Film
Physics
- Mirrors
- Growth
- Diffusivity
Organisaties
Publicaties
2024
Examining the influence of W thickness on the Si-on-W Interface: A comparative metrology analysis (2024)Applied surface science, 670. Article 160615. Valpreda, A., Sturm, J. M., Yakshin, A. E., Woitok, J. F., Lokhorst, H. W., Phadke, P. & Ackermann, M.https://doi.org/10.1016/j.apsusc.2024.160615Publisher's Note: "Growth and optical performance of short-period W/Al and polished W/Si/Al/Si multilayers" (vol 134, 155301, 2023) (2024)Journal of Applied Physics, 135(14). Article 149901. Ijpes, D., Yakshin, A. E., Sturm, J. M. & Ackermann, M.https://doi.org/10.1063/5.0209743The effect of W thickness on the interface Si-on-W, a Low-Energy Ion Scattering study (2024)[Contribution to conference › Poster] NWO Physics 2024. Valpreda, A., Sturm, J. M., Yakshin, A. E. & Ackermann, M.
2023
Interface smoothing in short-period W/B<sub>4</sub>C multilayers using neon ion beam polishing (2023)Journal of Applied Physics, 134(24). Article 245303. Ijpes, D., Yakshin, A. E., Sturm, J. M. & Ackermann, M. D.https://doi.org/10.1063/5.0175793Interface smoothing in short-period W/B4C multilayers using neon ion beam polishing (2023)Journal of Applied Physics, 134(24). Article 245303. IJpes, D., Yakshin, A., Sturm, J. M. & Ackermann, M.https://doi.org/10.1063/5.0175793Interface engineered ultrashort period soft X-ray multilayers: Growth, characterization, and optical response (2023)[Thesis › PhD Thesis - Research UT, graduation UT]. University of Twente. IJpes, D.https://doi.org/10.3990/1.9789036559270Growth and optical performance of short-period W/Al and polished W/Si/Al/Si multilayers (2023)Journal of Applied Physics, 134(15). Article 155301. IJpes, D., Yakshin, A., Sturm, J. M. & Ackermann, M.https://doi.org/10.1063/5.0168377Resolving buried interfaces with low energy ion scattering (2023)Journal of vacuum science & technology A: vacuum, surfaces, and films, 41(4). Article 043203. Valpreda, A., Sturm, J. M., Yakshin, A. E. & Ackermann, M.https://doi.org/10.1116/6.0002567Implementing 0.1 nm B4C barriers in ultrashort period 1.0 nm W/Si multilayers for increased soft x-ray reflectance (2023)Journal of Applied Physics, 133(24). Article 245301. IJpes, D., Yakshin, A., Sturm, J. M. & Ackermann, M.https://doi.org/10.1063/5.0153322Increasing soft x-ray reflectance of short-period W/Si multilayers using B<sub>4</sub>C diffusion barriers (2023)Journal of Applied Physics, 133(2). Article 025302. IJpes, D., Yakshin, A. E., Sturm, J. M. & Ackermann, M. D.https://doi.org/10.1063/5.0130677
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