Expertises
Material Science
- Reflectivity
- Surface
- Temperature
- Thin Films
Chemistry
- Liquid Film
Physics
- Mirrors
- Growth
- Diffusivity
Organisaties
Publicaties
2025
Unveiling the effect of adding B4C at the W-on-Si interface (2025)Surfaces and Interfaces, 72. Article 107471. Valpreda, A., Lokhorst, H. W., Sturm, J. M., Yakshin, A. E. & Ackermann, M.https://doi.org/10.1016/j.surfin.2025.107471Resolving the W-on-Si interface by non-destructive low energy ion scattering (2025)Surfaces and Interfaces, 70. Article 106879. Valpreda, A., Christenhusz, M., Sturm, J. M., Yakshin, A. E. & Ackermann, M.https://doi.org/10.1016/j.surfin.2025.106879Diving into thin-film interfaces using low energy ion scattering (2025)[Thesis › PhD Thesis - Research UT, graduation UT]. University of Twente. Valpreda, A.https://doi.org/10.3990/1.9789036565844Calcium Niobate nanosheets: a 2D model system for investigating LEIS surface and tail signals (2025)[Contribution to conference › Poster] LEIS Workshop 2025. Valpreda, A., Sturm, J. M., Yakshin, A. & Ackermann, M.
2024
High reflectance ultrashort period W/B4C x-ray multilayers via intermittent ion polishing (2024)Journal of Applied Physics, 136(24). Article 245302. IJpes, D., Yakshin, A. E. & Ackermann, M. D.https://doi.org/10.1063/5.0230745Resolving the W-on-Si interface by non-destructive low energy ion scattering (2024)[Working paper › Preprint]. Valpreda, A., Christenhusz, M., Sturm, J. M., Yakshin, A. E. & Ackermann, M.Examining the influence of W thickness on the Si-on-W Interface: A comparative metrology analysis (2024)Applied surface science, 670. Article 160615. Valpreda, A., Sturm, J. M., Yakshin, A. E., Woitok, J. F., Lokhorst, H. W., Phadke, P. & Ackermann, M.https://doi.org/10.1016/j.apsusc.2024.160615Publisher's Note: "Growth and optical performance of short-period W/Al and polished W/Si/Al/Si multilayers" (vol 134, 155301, 2023) (2024)Journal of Applied Physics, 135(14). Article 149901. Ijpes, D., Yakshin, A. E., Sturm, J. M. & Ackermann, M.https://doi.org/10.1063/5.0209743The effect of W thickness on the interface Si-on-W, a Low-Energy Ion Scattering study (2024)[Contribution to conference › Poster] NWO Physics 2024. Valpreda, A., Sturm, J. M., Yakshin, A. E. & Ackermann, M.
2023
Interface smoothing in short-period W/B4C multilayers using neon ion beam polishing (2023)Journal of Applied Physics, 134(24). Article 245303. IJpes, D., Yakshin, A., Sturm, J. M. & Ackermann, M.https://doi.org/10.1063/5.0175793
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