Expertises
Material Science
- Reflectivity
- Surface
- Temperature
- Thin Films
Chemistry
- Liquid Film
Physics
- Mirrors
- Growth
- Diffusivity
Organisaties
Publicaties
2024
Examining the influence of W thickness on the Si-on-W Interface: A comparative metrology analysis, Article 160615 (E-pub ahead of print/First online). Valpreda, A., Sturm, J. M., Yakshin, A. E., Woitok, J. F., Lokhorst, H. W., Phadke, P. & Ackermann, M.https://doi.org/10.1016/j.apsusc.2024.160615The effect of W thickness on the interface Si-on-W, a Low-Energy Ion Scattering study. Valpreda, A., Sturm, J. M., Yakshin, A. E. & Ackermann, M.
2023
Interface smoothing in short-period W/B4C multilayers using neon ion beam polishing, Article 245303. IJpes, D., Yakshin, A., Sturm, J. M. & Ackermann, M.https://doi.org/10.1063/5.0175793Interface engineered ultrashort period soft X-ray multilayers: Growth, characterization, and optical response. University of Twente. IJpes, D.https://doi.org/10.3990/1.9789036559270Growth and optical performance of short-period W/Al and polished W/Si/Al/Si multilayers, Article 155301. IJpes, D., Yakshin, A., Sturm, J. M. & Ackermann, M.https://doi.org/10.1063/5.0168377Resolving buried interfaces with low energy ion scattering, Article 043203. Valpreda, A., Sturm, J. M., Yakshin, A. E. & Ackermann, M.https://doi.org/10.1116/6.0002567Implementing 0.1 nm B4C barriers in ultrashort period 1.0 nm W/Si multilayers for increased soft x-ray reflectance, Article 245301. IJpes, D., Yakshin, A., Sturm, J. M. & Ackermann, M.https://doi.org/10.1063/5.0153322Increasing soft x-ray reflectance of short-period W/Si multilayers using B4C diffusion barriers, Article 025302. IJpes, D., Yakshin, A., Sturm, J. M. & Ackermann, M.https://doi.org/10.1063/5.0130677
2022
Influence of the Template Layer on the Structure and Ferroelectric Properties of PbZr<sub>0.52</sub>Ti<sub>0.48</sub>O<sub>3</sub> Films, 22210-22220. Lucke, P., Nematollahi, M., Bayraktar, M., Yakshin, A. E., Elshof, J. E. t. & Bijkerk, F.https://doi.org/10.1021/acsomega.2c00815Simulation of LEIS spectra: use of a Monte Carlo code to calculate reionization. Valpreda, A., Zameshin, A., Sturm, J. M., Yakshin, A. & Ackermann, M.
Onderzoeksprofielen
Vakken collegejaar 2023/2024
Vakken in het huidig collegejaar worden toegevoegd op het moment dat zij definitief zijn in het Osiris systeem. Daarom kan het zijn dat de lijst nog niet compleet is voor het gehele collegejaar.