Zilverling

B. Endres Forlin (Bruno)

Onderzoeker
EEMCS-CS-CAES
Zilverling 5054
b.endresforlin@utwente.nl
+31534892372
Visitekaartje

Expertises

  • Engineering

    • System-on-Chip
    • Cross Section
    • Experimental Investigation

  • Computer Science

    • Application
    • Core Processor
    • Decision Tree
    • Field Programmable Gate Arrays
    • Performance Monitoring

Organisaties

Publicaties

2025

Bloom Filters for Soft Error Detection: Neutron and Fault Injection Validation (2025)In 2025 IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS). Article 11116913 (IEEE Symposium on On-Line Testing (IOLTS); Vol. 2025). IEEE Advancing Technology for Humanity. Cishugi, E. S., Smit, T. T., Forlin, B., Cazzaniga, C., Chen, K.-H. & Ottavi, M.https://doi.org/10.1109/IOLTS65288.2025.11116913FPGA innovation research in the Netherlands: present landscape and future outlook (2025)Frontiers in High Performance Computing, 3. Article 1572844. Alachiotis, N., van den Belt, S., van der Vlugt, S., van der Walle, R., Safari, M., Endres Forlin, B., De Matteis, T., Al-Ars, Z., Jordans, R., Sousa de Almeida, A. J., Corradi, F., Baaij, C. & Varbanescu, A.-L.https://doi.org/10.3389/fhpcp.2025.1572844From Ground to Orbit: A Robust and Efficient Test Methodology for RISC-V Soft-Cores (2025)IEEE transactions on device and materials reliability, 25(1), 27-36. Forlin, B., Böhmer, K., Cazzaniga, C., Rech, P., Furano, G., Alachiotis, N. & Ottavi, M.https://doi.org/10.1109/TDMR.2025.3537718Trikarenos: Design and Experimental Characterization of a Fault-Tolerant 28nm RISC-V-based SoC (2025)IEEE transactions on nuclear science, 72(8), 2783-2792. Article 0b00006493e01518. Rogenmoser, M., Wiese, P., Forlin, B. E., Gurkaynak, F. K., Rech, P., Menicucci, A., Ottavi, M. & Benini, L.https://doi.org/10.1109/TNS.2025.3564739

2024

An Enhanced Fault Injection Framework for FPGA-Based Soft-Cores (2024)In 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). Article 10753564. IEEE. Smit, T. T., Forlin, B. E., Chen, K.-H., Souvatzoglou, I., Psarakis, M. & Ottavi, M.https://doi.org/10.1109/DFT63277.2024.10753564An Experimental Comparison of RISC-V Processors: Performance, Power, Area and Security - Special Session Paper (2024)In 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2024 (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT; Vol. 2024). IEEE. Lazzeri, E., Forlin, B. E., Furano, G., Ottavi, M. & Cassano, L.https://doi.org/10.1109/DFT63277.2024.10753540Neutron Beam Evaluation of Probabilistic Data Structure-based Online Checkers (2024)In 2024 IEEE 30th International Symposium on On-line Testing and Robust System Design, IOLTS 2024. IEEE. Forlin, B., Annink, E. B., Cishugi, E., Cazzaniga, C., Rech, P., Rauwerda, G., Furano, G. & Ottavi, M.https://doi.org/10.1109/IOLTS60994.2024.10616084Lightweight Instrumentation for Accurate Performance Monitoring in RTOSes (2024)In 2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024 - Proceedings (Proceedings -Design, Automation and Test in Europe, DATE). IEEE. Forlin, B., Chen, K. H., Alachiotis, N., Cassano, L. & Ottavi, M.https://ieeexplore.ieee.org/document/10546790

2023

Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs (2023)In 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023 (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT; Vol. 36). IEEE. Böhmer, K., Forlin, B., Cazzaniga, C., Rech, P., Furano, G., Alachiotis, N. & Ottavi, M.https://doi.org/10.1109/DFT59622.2023.10313556An unprotected RISC-V Soft-core processor on an SRAM FPGA: Is it as bad as it sounds? (2023)In Proceedings - 2023 IEEE European Test Symposium, ETS 2023 (Proceedings IEEE European Test Symposium (ETS); Vol. 2023). IEEE. Forlin, B. E., van Huffelen, W., Cazzaniga, C., Rech, P., Alachiotis, N. & Ottavi, M.https://doi.org/10.1109/ETS56758.2023.10174076

Onderzoeksprofielen

Vakken collegejaar 2025/2026

Vakken in het huidig collegejaar worden toegevoegd op het moment dat zij definitief zijn in het Osiris systeem. Daarom kan het zijn dat de lijst nog niet compleet is voor het gehele collegejaar.

Vakken collegejaar 2024/2025

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