Welkom...

dr. C.G. Zeinstra (Chris)

Universitair docent

Expertises

Engineering & Materials Science
Biometrics
Classifiers
Face Recognition
Image Resolution
Software Packages
Mathematics
Classifier
Physics & Astronomy
Confidence
Intervals

Publicaties

Recent
Bassit, A. , Hahn, F. , Zeinstra, C. , Veldhuis, R. , & Peter, A. (2021). Bloom Filter vs Homomorphic Encryption: Which approach protects the biometric data and satisfies ISO/IEC 24745? In BIOSIG 2021 - Proceedings of the 20th International Conference of the Biometrics Special Interest Group: 15.-17. September 2021 International Digital Conference IEEE. https://doi.org/10.1109/BIOSIG52210.2021.9548304
Zeinstra, C. , Meuwly, D. , Veldhuis, R. , & Spreeuwers, L. (2019). Mind the Gap: A practical framework for classifiers in a forensic context. In 2018 IEEE 9th International Conference on Biometrics Theory, Applications and Systems, BTAS 2018 [8698583] (IEEE nternational Conference on Biometrics Theory, Applications and Systems (BTAS); Vol. 2018). IEEE. https://doi.org/10.1109/BTAS.2018.8698583
Zeinstra, C. , & Haasnoot, E. (2018). Shallow CNNs for the Reliable Detection of Facial Marks. In A. Bromme, A. Uhl, C. Busch, C. Rathgeb, & A. Dantcheva (Eds.), 2018 International Conference of the Biometrics Special Interest Group, BIOSIG 2018 [8553157] (International Conference of the Biometrics Special Interest Group (BIOSIG); Vol. 2018). IEEE. https://doi.org/10.23919/BIOSIG.2018.8553157
Haasnoot, E., Khodabakhsh, A. , Zeinstra, C. , Spreeuwers, L. , & Veldhuis, R. (2018). FEERCI: A Package for Fast Non-Parametric Confidence Intervals for Equal Error Rates in Amortized O(m log n). In A. Bromme, A. Uhl, C. Busch, C. Rathgeb, & A. Dantcheva (Eds.), 2018 International Conference of the Biometrics Special Interest Group, BIOSIG 2018 [8553607] (International Conference of the Biometrics Special Interest Group (BIOSIG); Vol. 2018). IEEE. https://doi.org/10.23919/BIOSIG.2018.8553607
Zeinstra, C. , Veldhuis, R. , & Spreeuwers, L. (2017). How Random Is a Classifier Given Its Area under Curve? In A. Brömme, C. Busch, A. Dantcheva, C. Rathgeb, & A. Uhl (Eds.), 2017 International Conference of the Biometrics Special Interest Group (BIOSIG): BIOSIG 2017 [8053509] Gesellschaft für Informatik. https://doi.org/10.23919/BIOSIG.2017.8053509
Zeinstra, C. , Veldhuis, R. , Spreeuwers, L., & Ruifrok, A. (2017). Manually annotated characteristic descriptors: Measurability and variability. In 2017 5th International Workshop on Biometrics and Forensics (IWBF 2017) [7935095] IEEE. https://doi.org/10.1109/IWBF.2017.7935095

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Contactgegevens

Bezoekadres

Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Zilverling (gebouwnr. 11), kamer 4096
Hallenweg 19
7522NH  Enschede

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Postadres

Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Zilverling  4096
Postbus 217
7500 AE Enschede