Welkom...

dr.ir. C. Salm (Cora)

Docent

Expertises

Plasmas
Damage
Plasmas
Oxides
Oxides
Capacitors
Breakdown
Antennas
Detectors
Networks (Circuits)
Electrons
Life (Durability)
Degradation
Thin Films
Electromigration
Capacitance

Publicaties

Recent
Wang, J., Bielen, J., Salm, C., & Schmitz, J. (2016). Spring-constant measurement methods for RF-MEMS capacitive switches. In 2016 International Conference on Microelectronic Test Structures (ICMTS) (pp. 10-14). USA: IEEE. DOI: 10.1109/ICMTS.2016.7476164
van der Graaf, H., Aarnink, A. A. I., Aarts, A., van Bakel, N., Berbee, E., Berkien, A., ... Wyrsch, N. (2013). The gridpix detector: History and perspective. Modern physics letters. A, 28(28-13), 13400211-13400217. DOI: 10.1142/S021773231340021X
Wang, J., Salm, C., & Schmitz, J. (2013). Comparison of C-V measurement methods for RF-MEMS capacitive switches. In IEEE International Conference on Microelectronic Test Structures, ICMTS 2013 (pp. 53-58). USA: IEEE Electron Devices Society. DOI: 10.1109/ICMTS.2013.6528145

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Contactgegevens

Bezoekadres

Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Carré (gebouwnr. 15), kamer 2611
Hallenweg 23
7522NH  Enschede

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Postadres

Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Carré  2611
Postbus 217
7500 AE Enschede

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