Expertises
Physics
- Electric Potential
- Wafer
Material Science
- Devices
- Detector
- Temperature
- Hot Carrier
- Metal
- Switch
Organisaties
Publicaties
2022
Recovery of hot-carrier degraded nMOSFETs (2022)[Thesis › PhD Thesis - Research UT, graduation UT]. University of Twente. de Jong, M. J.https://doi.org/10.3990/1.9789036553438
2020
Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices (2020)In 2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings. Article 9129540 (IEEE International Reliability Physics Symposium Proceedings; Vol. 2020-April). IEEE. De Jong, M. J., Salm, C. & Schmitz, J.https://doi.org/10.1109/IRPS45951.2020.9129540Analysis of short-circuit transients in the LHC main dipole circuit (2020)Journal of physics: Conference series, 1559(1). Article 012077. Liakopoulou, A., Annema, A. J., Bortot, L., Charifoulline, Z., MacIejewski, M., Prioli, M., Ravaioli, E., Salm, C., Schmitz, J. & Verweij, A. P.https://doi.org/10.1088/1742-6596/1559/1/012077RFID Tag Failure after Thermal Overstress (2020)In 2019 IEEE International Integrated Reliability Workshop, IIRW 2019. Article 8989885. IEEE. Ozturk, E., Dikkers, M. J., Batenburg, K. M., Salm, C. & Schmitz, J.https://doi.org/10.1109/IIRW47491.2019.8989885
2019
Recovery after hot-carrier injection: Slow versus fast traps (2019)Microelectronics reliability, 100-101. Article 113318. de Jong, M. J., Salm, C. & Schmitz, J.https://doi.org/10.1016/j.microrel.2019.06.010
Onderzoeksprofielen
Vakken collegejaar 2024/2025
Vakken in het huidig collegejaar worden toegevoegd op het moment dat zij definitief zijn in het Osiris systeem. Daarom kan het zijn dat de lijst nog niet compleet is voor het gehele collegejaar.
- 191211000 - Semiconductor Project
- 191211208 - Internship EE
- 191211219 - Master Thesis Project
- 191211650 - Multi-Disciplinary Design Project
- 201600187 - Individual Project
- 201700174 - Internship & Job Orientation Project NT
- 201800381 - CS BIOS
- 201900223 - Capita Selecta Electrical Engineering
- 202001116 - Circuit Analysis 1
- 202001117 - Sensors & Actuators Project
- 202001162 - Bachelor Thesis EE
- 202001167 - EE Participation in Large Multi. Project
- 202001434 - Internship EMSYS
- 202100254 - Complex System Design
- 202100256 - Survey Paper
- 202300070 - Final Project EMSYS
- 202400659 - Combined Final Project EE / AP
Vakken collegejaar 2023/2024
- 191211000 - Semiconductor Project
- 191211208 - Internship EE
- 191211219 - Master Thesis Project
- 191211440 - Integrated Circuit Technology
- 191211650 - Multi-Disciplinary Design Project
- 201600017 - Final Project Preparation
- 201600187 - Individual Project
- 201700174 - Internship & Job Orientation Project NT
- 201800381 - CS BIOS
- 201900135 - Advanced Semiconductor Device Physics
- 201900200 - Final Project EMSYS
- 201900223 - Capita Selecta Electrical Engineering
- 202000657 - Data, Statistics & Probability for Eng.
- 202001116 - Circuit Analysis 1
- 202001117 - Sensors & Actuators Project
- 202001122 - Power Electronics Project
- 202001162 - Bachelor Thesis EE
- 202001167 - EE Participation in Large Multi. Project
- 202001213 - Calculus 1 for EE
- 202001434 - Internship EMSYS
- 202100254 - Complex System Design
- 202100256 - Survey Paper
- 202100346 - Internship EE/AP
- 202300020 - Energy Transition Challenges
- 202300070 - Final Project EMSYS
Adres
![](/.uc/ia3848a2a0103e7e5110085e4f403ff94cdef11c068080801e3bc0268018041/carre.png)
Universiteit Twente
Carré (gebouwnr. 15), kamer C2611
Hallenweg 23
7522 NH Enschede
Universiteit Twente
Carré C2611
Postbus 217
7500 AE Enschede