Expertises
Engineering & Materials Science
# Detectors
# Hot Carriers
# Imaging Techniques
# Photocathodes
# Photons
# Recovery
Physics & Astronomy
# Chips
# Detectors
Verbonden aan
Publicaties
Recent
de Jong, M. J. (2022).
Recovery of hot-carrier degraded nMOSFETs. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente.
https://doi.org/10.3990/1.9789036553438
De Jong, M. J.
, Salm, C.
, & Schmitz, J. (2020).
Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices. In
2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings [9129540] (IEEE International Reliability Physics Symposium Proceedings; Vol. 2020-April). IEEE.
https://doi.org/10.1109/IRPS45951.2020.9129540
Liakopoulou, A.
, Annema, A. J., Bortot, L., Charifoulline, Z., MacIejewski, M., Prioli, M.
, Ravaioli, E.
, Salm, C.
, Schmitz, J.
, & Verweij, A. P. (2020).
Analysis of short-circuit transients in the LHC main dipole circuit.
Journal of physics: Conference series,
1559(1), [012077].
https://doi.org/10.1088/1742-6596/1559/1/012077
Ozturk, E.
, Dikkers, M. J.
, Batenburg, K. M.
, Salm, C.
, & Schmitz, J. (2020).
RFID Tag Failure after Thermal Overstress. In
2019 IEEE International Integrated Reliability Workshop, IIRW 2019 [8989885] IEEE.
https://doi.org/10.1109/IIRW47491.2019.8989885
Liakopoulou, A.
, Annema, A. J., Bortot, L., Charifoulline, Z., Maciejewski, M., Prioli, M.
, Ravaioli, E.
, Salm, C.
, Schmitz, J.
, & Verweij, A. P. (2019).
Analysis of Short-Circuit Transients in the LHC Main Dipole Circuit. Abstract from 14th European Conference on Applied Superconductivity, EUCAS 2019, Glasgow, United Kingdom.
de Jong, M. J.
, Salm, C.
, & Schmitz, J. (2019).
Recovery after hot-carrier injection: Slow versus fast traps.
Microelectronics reliability,
100-101, [113318].
https://doi.org/10.1016/j.microrel.2019.06.010
de Jong, M. J.
, Salm, C.
, & Schmitz, J. (2018).
Towards understanding recovery of hot-carrier induced degradation.
Microelectronics reliability,
88-90, 147-151.
https://doi.org/10.1016/j.microrel.2018.07.057
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Vakken Collegejaar 2022/2023
Vakken in het huidig collegejaar worden toegevoegd op het moment dat zij definitief zijn in het Osiris systeem. Daarom kan het zijn dat de lijst nog niet compleet is voor het gehele collegejaar.
Vakken Collegejaar 2021/2022
Contactgegevens
Bezoekadres
Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré
(gebouwnr. 15), kamer C2611
Hallenweg 23
7522NH Enschede
Postadres
Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré
C2611
Postbus 217
7500 AE Enschede