Expertises
Physics & Astronomy
# Cyclotrons
# Degradation
# Energy
# Laminates
# Polishing
# Reflectance
# Roughness
# Tumors
Verbonden aan
Publicaties
Recent
IJpes, D.
, Yakshin, A.
, Sturm, J. M., & Ackermann, M. (2023).
Increasing soft X-ray reflectance of short-period W/Si multilayers using B4C diffusion barriers.
Journal of Applied Physics,
133(2), [025302].
https://doi.org/10.1063/5.0130677
Medvedev, R. V.
, Nikolaev, K. V.
, Zameshin, A. A.
, Ijpes, D.
, Makhotkin, I. A., Yakunin, S. N.
, Yakshin, A. E.
, & Bijkerk, F. (2019).
Low-energy ion polishing of Si in W/Si soft X-ray multilayer structures.
Journal of Applied Physics,
126(4), [045302].
https://doi.org/10.1063/1.5097378
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Universiteit Twente
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Postadres
Universiteit Twente
Faculty of Science and Technology
Carré
Postbus 217
7500 AE Enschede