Welkom...

dr. E. Louis (Eric)

Universitair hoofddocent

Expertises

Multilayers
Wavelengths
Optics
Mirrors
Damage
Reflectance
Wavelength
Optics

Publicaties

Recent
Makhotkin, I. A., Sobierajski, R., Chalupský, J., Tiedtke, K., de Vries, G., Störmer, M., ... Enkisch, H. (2018). Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold. Journal of synchrotron radiation, 25(1), 77-84. DOI: 10.1107/S1600577517017362
Makhotkin, I. A., Sobierajski, R., Chalupsky, J., Tiedtke, K., de Vries, G., Störmer, M., ... Enkisch, H. (2018). Experimental study of EUV-mirror radiation damage resistance under long term FEL exposures below the single shot damage threshold. Journal of synchrotron radiation, 25(1), 77-84. DOI: 10.1107/S1600577517017362
Huang, Q., Yi, Q., Cao, Z., Qi, R., Loch, R. A., Jonnard, P., ... Wang, Z. (2017). High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region. Scientific reports, 7(1), [12929]. DOI: 10.1038/s41598-017-13222-5
Senf, F., Bijkerk, F., Eggenstein, F., Gwalt, G., Huang, Q., van de Kruijs, R. W. E., ... Erko, A. (2016). Highly efficient blazed grating with multilayer coating for tender X-ray energies. Optics express, 24(12), 13220-13230. DOI: 10.1364/OE.24.013220
Sobierajski, R., Jacyna, I., Dluzewski, P., Klepka, M., Klinger, D., Pelka, J. B., ... Chalupsky, J. (2016). Role of heat accumulation in the multi-shot damage of silicon irradiated with femtosecond XUV pulses at a 1 Mhz repetition rate. Optics express, 24(14), 15468-15477. DOI: 10.1364/OE.24.015468

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Bezoekadres

Universiteit Twente
Faculteit Technische Natuurwetenschappen
Carré (gebouwnr. 15), kamer 2021
Hallenweg 23
7522NH  Enschede

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Postadres

Universiteit Twente
Faculteit Technische Natuurwetenschappen
Carré  2021
Postbus 217
7500 AE Enschede