dr.ir. E.P. Houwman (Evert) | Universiteit Twente

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Thin Films

Thin Films

Thin Films

Substrates

Ferroelectric Materials

Silicon

Silicon

Oxides

Oxides

Li, L., Liao, Z., Gauquelin, N., Nguyen, M. D., Hueting, R. J. E., Gravesteijn, D. J., ... Rijnders, G. (2018). Epitaxial Stress-Free Growth of High Crystallinity Ferroelectric PbZr_0.52Ti_0.48O₃ on GaN/AlGaN/Si(111) Substrate. Advanced materials interfaces, 5(2), [1700921]. DOI: 10.1002/admi.201700921

Houwman, E. P. (2017). Flexoelectricity induced large tunable self-bias by a PZT interfacial layer of epitaxial PMN-PT ferroelectric capacitors.

Nguyen, M. D., Houwman, E. P., & Rijnders, G. (2017). Large piezoelectric strain with ultra-low strain hysteresis in highly c-axis oriented Pb(Zr_0.52Ti_0.48)O₃ films with columnar growth on amorphous glass substrates. Scientific reports, 7(1), [12915]. DOI: 10.1038/s41598-017-13425-w

Nguyen, M. D., Houwman, E. P., Yuan, H., Wylie- Van Eerd, B., Dekkers, M., Koster, G., ... Rijnders, G. (2017). Controlling Piezoelectric Responses in Pb(Zr_0.52Ti_0.48)O₃ Films through Deposition Conditions and Nanosheet Buffer Layers on Glass. ACS applied materials & interfaces, 9(41), 35947-35957. DOI: 10.1021/acsami.7b07428

Nguyen, C. T. Q., Nguyen, D. M., Vu, H. T., Houwman, E. P., Vu, H. N., & Rijnders, A. J. H. M. (2017). High energy storage responses in all-oxide epitaxial relaxor ferroelectric thin films with the coexistence of relaxor and antiferroelectric-like behaviors. Thin solid films, 636, 188-192. DOI: 10.1016/j.tsf.2017.06.003

Nguyen, D. M., Houwman, E. P., Dekkers, J. M., & Rijnders, A. J. H. M. (2017). Strongly Enhanced Piezoelectric Response in Lead Zirconate Titanate Films with Vertically-Aligned Columnar Grains. ACS applied materials & interfaces, 9(11), 9849-9861. DOI: 10.1021/acsami.6b16470

Nguyen, D. M., Houwman, E. P., Dekkers, J. M., Schlom, D. G., & Rijnders, A. J. H. M. (2017). Research update: Enhancement of figure of merit for energy-harvesters based on free-standing epitaxial Pb(Zr0.52Ti0.48)0.99Nb0.01O3 thin-film cantilevers. APL materials, 5(7), [074201]. DOI: 10.1063/1.4978273

Wang, J., Houwman, E. P., Salm, C., Nguyen, D. M., Vergeer, K., & Schmitz, J. (2017). Process induced poling and plasma induced damage of thin films PZT. Microelectronic engineering, 177, 13-18. DOI: 10.1016/j.mee.2017.01.016

Houwman, E. P., Vergeer, K., Koster, G., & Rijnders, A. J. H. M. (2017). Functional Properties of Polydomain Ferroelectric Oxide Thin Films. In H. Nishikawa, N. Iwata, T. Endo, Y. Takamura, G-H. Lee, & P. Mele (Eds.), Correlated Functional Oxides: Nanocomposites and Heterostructures (pp. 29-53). Springer International Publishing. DOI: 10.1007/978-3-319-43779-8

Nguyen, D. M., Dekkers, J. M., Houwman, E. P., Vu, H. T., Vu, H. N., & Rijnders, A. J. H. M. (2016). Lead-free (K0.5Na0.5)NbO3 thin films by pulsed laser deposition driving MEMS-based piezoelectric cantilevers. Materials letters, 164, 413-416. DOI: 10.1016/j.matlet.2015.11.044

Naar mijn profiel

+31534892860 (bij geen gehoor)

e.p.houwman@utwente.nl

Bezoekadres

Universiteit Twente
Faculteit Technische Natuurwetenschappen
Carré (gebouwnr. 15), kamer 3215
Hallenweg 23
7522NH Enschede

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Postadres

Universiteit Twente
Faculteit Technische Natuurwetenschappen
Carré 3215
Postbus 217
7500 AE Enschede

Universiteit Twente Drienerlolaan 5
7522 NB Enschede

+31 (0)53 489 9111
info@utwente.nl
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