dr.ir. E.P. Houwman (Evert) | Universiteit Twente

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Thin Films

Thin Films

Thin Films

Substrates

Ferroelectric Materials

Silicon

Silicon

Pulsed Laser Deposition

Pulsed Laser Deposition

Nguyen, M. D., Houwman, E. P., & Rijnders, G. (2018). Energy Storage Performance and Electric Breakdown Field of Thin Relaxor Ferroelectric PLZT Films Using Microstructure and Growth Orientation Control. Journal of physical chemistry C, 122(27), 15171-15179. DOI: 10.1021/acs.jpcc.8b04251

Li, L., Liao, Z., Gauquelin, N., Nguyen, M. D., Hueting, R. J. E., Gravesteijn, D. J., ... Rijnders, G. (2018). Epitaxial Stress-Free Growth of High Crystallinity Ferroelectric PbZr_0.52Ti_0.48O₃ on GaN/AlGaN/Si(111) Substrate. Advanced materials interfaces, 5(2), [1700921]. DOI: 10.1002/admi.201700921

Houwman, E. P. (2017). Flexoelectricity induced large tunable self-bias by a PZT interfacial layer of epitaxial PMN-PT ferroelectric capacitors.

Nguyen, M. D., Houwman, E. P., & Rijnders, G. (2017). Large piezoelectric strain with ultra-low strain hysteresis in highly c-axis oriented Pb(Zr_0.52Ti_0.48)O₃ films with columnar growth on amorphous glass substrates. Scientific reports, 7(1), [12915]. DOI: 10.1038/s41598-017-13425-w

Nguyen, M. D., Houwman, E. P., Yuan, H., Wylie- Van Eerd, B., Dekkers, M., Koster, G., ... Rijnders, G. (2017). Controlling Piezoelectric Responses in Pb(Zr_0.52Ti_0.48)O₃ Films through Deposition Conditions and Nanosheet Buffer Layers on Glass. ACS applied materials & interfaces, 9(41), 35947-35957. DOI: 10.1021/acsami.7b07428

Nguyen, C. T. Q., Nguyen, D. M., Vu, H. T., Houwman, E. P., Vu, H. N., & Rijnders, A. J. H. M. (2017). High energy storage responses in all-oxide epitaxial relaxor ferroelectric thin films with the coexistence of relaxor and antiferroelectric-like behaviors. Thin solid films, 636, 188-192. DOI: 10.1016/j.tsf.2017.06.003

Nguyen, D. M., Houwman, E. P., Dekkers, J. M., & Rijnders, A. J. H. M. (2017). Strongly Enhanced Piezoelectric Response in Lead Zirconate Titanate Films with Vertically-Aligned Columnar Grains. ACS applied materials & interfaces, 9(11), 9849-9861. DOI: 10.1021/acsami.6b16470

Nguyen, D. M., Houwman, E. P., Dekkers, J. M., Schlom, D. G., & Rijnders, A. J. H. M. (2017). Research update: Enhancement of figure of merit for energy-harvesters based on free-standing epitaxial Pb(Zr0.52Ti0.48)0.99Nb0.01O3 thin-film cantilevers. APL materials, 5(7), [074201]. DOI: 10.1063/1.4978273

Wang, J., Houwman, E. P., Salm, C., Nguyen, D. M., Vergeer, K., & Schmitz, J. (2017). Process induced poling and plasma induced damage of thin films PZT. Microelectronic engineering, 177, 13-18. DOI: 10.1016/j.mee.2017.01.016

Houwman, E. P., Vergeer, K., Koster, G., & Rijnders, A. J. H. M. (2017). Functional Properties of Polydomain Ferroelectric Oxide Thin Films. In H. Nishikawa, N. Iwata, T. Endo, Y. Takamura, G-H. Lee, & P. Mele (Eds.), Correlated Functional Oxides: Nanocomposites and Heterostructures (pp. 29-53). Springer International Publishing. DOI: 10.1007/978-3-319-43779-8

Naar mijn profiel

+31534892860 (bij geen gehoor)

e.p.houwman@utwente.nl

Bezoekadres

Universiteit Twente
Faculteit Technische Natuurwetenschappen
Carré (gebouwnr. 15), kamer C3215
Hallenweg 23
7522NH Enschede

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Postadres

Universiteit Twente
Faculteit Technische Natuurwetenschappen
Carré C3215
Postbus 217
7500 AE Enschede

Universiteit Twente Drienerlolaan 5
7522 NB Enschede

+31 (0)53 489 9111
info@utwente.nl
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