Welkom...

prof.dr. F. Bijkerk (Fred)

Hoogleraar en Programmaleider Industriële Focusgroep XUV Optics

Expertises

Multilayers
Mirrors
Wavelengths
Reflectance
Ions
Gratings
Optics
Wavelength

Publicaties

Recente Artikelen
Reinink, J., van de Kruijs, R. W. E., & Bijkerk, F. (2017). Interface study of Mo/Si systems using LEIS and in-situ stress analysis. Poster session presented at 304. PTB-Seminar VUV and EUV Metrology, Berlin, Germany.
Liu, F., Bayraktar, M., Frijns, O., Bijkerk, F., Goossens, T., & Rommers, J. (2017). EUV source spectroscopic measurement. Poster session presented at 18th ASML Technology Conference 2017, Veldhoven, Netherlands.
Bayraktar, M., Liu, F., Bastiaens, H. M. J., Bruineman, C., Vratzov, B., & Bijkerk, F. (2017). Broadband spectrometer development based on high-density free-standing transmission gratings. Poster session presented at 304. PTB-Seminar VUV and EUV Metrology, Berlin, Germany.
Sturm, J. M., Coloma Ribera, R., van de Kruijs, R. W. E., Yakshin, A., & Bijkerk, F. (2017). In vacuo low-energy ions scattering studies of ZrO2 growth by magnetron sputtering. In In vacuo low-energy ions scattering studies of ZrO2 growth by magnetron sputtering
Huang, Q., Yi, Q., Cao, Z., Qi, R., Loch, R. A., Jonnard, P., ... Wang, Z. (2017). High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region. Scientific reports, 7(1), [12929]. DOI: 10.1038/s41598-017-13222-5

Pure Link

Contactgegevens

Bezoekadres

Universiteit Twente
Faculteit Technische Natuurwetenschappen
Carré (gebouwnr. 15), kamer 2025
Hallenweg 23
7522NH  Enschede

Navigeer naar locatie

Postadres

Universiteit Twente
Faculteit Technische Natuurwetenschappen
Carré  2025
Postbus 217
7500 AE Enschede