Welkom...

prof.dr. F. Bijkerk (Fred)

Hoogleraar Industriële Focusgroep XUV Optics

Expertises

Physics & Astronomy
Lithography
Mirrors
Optics
Reflectance
Thin Films
Wavelengths
Engineering & Materials Science
Multilayers
Chemistry
Multilayer

Publicaties

Recent
Bayraktar, M., Liu, F., Versolato, O. , & Bijkerk, F. (2023). EUV Source Metrology. In V. Bakshi (Ed.), Photon Sources for Lithography and Metrology (pp. 509-535) https://doi.org/10.1117/3.2638242.ch13
Chandrasekaran, A. (2022). Surface and interface diffusion processes in nanoscale thin films. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente. https://doi.org/10.3990/1.9789036554763
Shafikov, A. (2022). Fracture behavior and characterization of free-standing metal silicide thin films. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente. https://doi.org/10.3990/1.9789036554251
Phadke, P. , Zameshin, A. A. , Sturm, J. M. , van de Kruijs, R. W. E. , & Bijkerk, F. (2022). Sputter yields of monoatomic solids by Ar and Ne ions near the threshold: A Bayesian analysis of the Yamamura Model. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 520, 29-39. Advance online publication. https://doi.org/10.1016/j.nimb.2022.03.016
Kizir, S. (2022). Nucleation, growth and hydrogen resistance of multi-layer graphene. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente. https://doi.org/10.3990/1.9789036552820

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Contactgegevens

Bezoekadres

Universiteit Twente
Faculty of Science and Technology
Carré (gebouwnr. 15), kamer C2025
Hallenweg 21
7522NH  Enschede

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Postadres

Universiteit Twente
Faculty of Science and Technology
Carré  C2025
Postbus 217
7500 AE Enschede