Welkom...

prof.dr. F. Bijkerk (Fred)

Emeritus Hoogleraar XUV Optiek

Expertises

Physics & Astronomy
Lithography
Mirrors
Optics
Reflectance
Thin Films
Wavelengths
Engineering & Materials Science
Multilayers
Chemistry
Multilayer

Publicaties

Recent
Şimşek, E., Vries, S. E., Jansen, B., Steur, M. , Bijkerk, F. , Bayraktar, M. , & Ackermann, M. (2023). Active Wafer Table Based on Piezoelectric Thin Films. Poster session presented at NWO Physics 2023, Veldhoven, Netherlands.
Bayraktar, M., Liu, F., Versolato, O. , & Bijkerk, F. (2023). EUV Source Metrology. In V. Bakshi (Ed.), Photon Sources for Lithography and Metrology (pp. 509-535) https://doi.org/10.1117/3.2638242.ch13
Chandrasekaran, A. (2022). Surface and interface diffusion processes in nanoscale thin films. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente. https://doi.org/10.3990/1.9789036554763
Shafikov, A. (2022). Fracture behavior and characterization of free-standing metal silicide thin films. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente. https://doi.org/10.3990/1.9789036554251
Kizir, S. (2022). Nucleation, growth and hydrogen resistance of multi-layer graphene. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente. https://doi.org/10.3990/1.9789036552820

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Contactgegevens

Bezoekadres

Universiteit Twente
Faculty of Science and Technology
Carré (gebouwnr. 15), kamer C2025
Hallenweg 21
7522NH  Enschede

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Postadres

Universiteit Twente
Faculty of Science and Technology
Carré  C2025
Postbus 217
7500 AE Enschede