Expertises
Physics
- Thin Films
- Eddy
- Electron Diffraction
- Expulsion
- Variations
Chemistry
- Liquid Film
- Reflection High Energy Electron Diffraction
Earth and Planetary Sciences
- Variation
Organisaties
Publicaties
2020
Mapping unit-cell thickness variations in thin films by post-deposition reflection high-energy electron diffraction, Article 083806. Smink, A. E. M., Birkhölzer, Y. A., Van Dam, J., Roesthuis, F. J. G., Rijnders, G., Hilgenkamp, H. & Koster, G.https://doi.org/10.1103/PhysRevMaterials.4.083806
Onderzoeksprofielen
Adres
![](/.uc/ia3848a2a0103e7e5110085e4f403ff94cdef11c068080801e3bc0268018041/carre.png)
Universiteit Twente
Carré (gebouwnr. 15), kamer C2065
Hallenweg 23
7522 NH Enschede
Universiteit Twente
Carré C2065
Postbus 217
7500 AE Enschede