Expertises
Engineering & Materials Science
# Cells
# Reflection High Energy Electron Diffraction
# Thin Films
Chemistry
# Reflection High Energy Electron Diffraction
Physics & Astronomy
# Expulsion
# High Energy Electrons
# Strip
# Thin Films
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Publicaties
Recent
Smink, A. E. M.
, Birkhölzer, Y. A., Van Dam, J.
, Roesthuis, F. J. G.
, Rijnders, G.
, Hilgenkamp, H.
, & Koster, G. (2020).
Mapping unit-cell thickness variations in thin films by post-deposition reflection high-energy electron diffraction.
Physical Review Materials ,
4(8), Article 083806.
https://doi.org/10.1103/PhysRevMaterials.4.083806
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Universiteit Twente
Faculty of Science and Technology
Carré
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Hallenweg 21
7522NH Enschede
Postadres
Universiteit Twente
Faculty of Science and Technology
Carré
C2065
Postbus 217
7500 AE Enschede