Expertises

  • Engineering

    • Measurement
    • Electromagnetic Interference
  • Physics

    • Frequencies
    • Reverberation
    • Measuring Instruments
    • Electromagnetism
    • Environment
    • Domains

Organisaties

Nevenwerkzaakheden

  • Nationaal Metrologie LaboratoriumLid van de Raad van Deskundigen van het Van Swinden Laboratorium
  • Thales NederlandFull-time employment

Publicaties

2023
Effect of Wall Shaking Amplitude on Vibrating Intrinsic Reverberation Chamber CharacteristicsIEEE transactions on electromagnetic compatibility, 1-8. Hara, M., Wang, J. & Leferink, F.https://doi.org/10.1109/TEMC.2023.3331056Numerical Derivation of Design Guidelines for Tightness and Shaking Amplitude of Vibrating Intrinsic Reverberation Chamber by Method of MomentIEICE transactions on communications, E106B(11), 1173-1181. Hara, M., Wang, J. & Leferink, F.https://doi.org/10.1587/transcom.2023EBP3002Utilization of the Return Conductor for Cancellation of CM Currents for a PMSM Inverter DriveIn 2023 International Symposium on Electromagnetic Compatibility - EMC Europe, EMC Europe 2023. IEEE. Koch, P., Malburg, L., Moonen, N. & Leferink, F.https://doi.org/10.1109/EMCEurope57790.2023.10274251Risk of EMI due to Necessary Modification in a Remote Microgrid in IndonesiaIn 2023 International Symposium on Electromagnetic Compatibility – EMC Europe. IEEE. Sulaeman Islahuzzaman, I., Matthee, A., Hafsah, H., Akhmad, K., Moonen, N., Popović, J. & Leferink, F.https://doi.org/10.1109/EMCEurope57790.2023.10274415Investigating the CM Noise Generated by Different Configurations of Multiple Forward ConvertersIn 2023 International Symposium on Electromagnetic Compatibility - EMC Europe, EMC Europe. IEEE. Feloups, C. E. S., Adhena, H. H., Moonen, N., Thomas, D. & Leferink, F.https://doi.org/10.1109/EMCEurope57790.2023.10274401Analysis of Multi-Filter EMI Mitigation for Weight and Volume OptimizationIn 2023 International Symposium on Electromagnetic Compatibility - EMC Europe, EMC Europe 2023. IEEE. Malburg, L., Moonen, N. & Leferink, F.https://doi.org/10.1109/EMCEurope57790.2023.10274223Unexpected Common Mode Choke SaturationIn 2023 International Symposium on Electromagnetic Compatibility - EMC Europe, EMC Europe 2023. IEEE. Nemashkalo, D., Koch, P., Moonen, N. & Leferink, F.https://doi.org/10.1109/EMCEurope57790.2023.10274369Introduction to Physical Layer Security and Hardware Supply Chain Security: EM Tricks to Keep Your Information and Devices SafeIn 2023 International Symposium on Electromagnetic Compatibility - EMC Europe, Article 23865790. IEEE. Hayashi, Y., Leferink, F. & Nagata, M.https://doi.org/10.1109/EMCEurope57790.2023.10274206TEMPEST Demo for Increasing AwarenessIn 2023 International Symposium on Electromagnetic Compatibility - EMC Europe, Article 23865686. IEEE. Groot, R., Van Meeteren, D. & Leferink, F.https://doi.org/10.1109/EMCEurope57790.2023.10274402Challenges in Risk-based EMC for MRI SystemsIn 2023 International Symposium on Electromagnetic Compatibility - EMC Europe 2023, Article 23865693 (pp. 1-6). IEEE. Velez, S. R., van Helvoort, M. J. A. M., Vogt-Ardatjew, R., van den Berg, B. & Leferink, F.https://doi.org/10.1109/EMCEurope57790.2023.10274190

Onderzoeksprofielen

Adres

Universiteit Twente

Carré (gebouwnr. 15), kamer C2441
Hallenweg 23
7522 NH Enschede

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