G. Ali MSc (Ghazanfar)

Ali, G., Bagheriye, L., Manhaeve, H. , & Kerkhoff, H. G. (2020). On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs. In IEEE Asian Test Symposium, ATS 2020 (IEEE Asian Test Symposium (ATS); Vol. 2020, No. 29). IEEE. https://doi.org/10.1109/ATS49688.2020.9301509

Bagheriye, L. , Ali, G. , & Kerkhoff, H. G. (2020). Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning. In IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2020 (pp. 1-4). (IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS); Vol. 2020, No. 26). IEEE. https://doi.org/10.1109/IOLTS50870.2020.9159753

Ali, G., Bagheriye, L. , & Kerkhoff, H. G. (2020). On-Chip Embedded Instruments Data Fusion and Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning. In IEEE International Symposium on Circuits and Systems, ISCAS 2020 (pp. 1-5). (IEEE International Symposium on Circuits and Systems (ISCAS); Vol. 2020). IEEE. https://doi.org/10.1109/ISCAS45731.2020.9180773

Ali, G. , Pathros, J. , & Kerkhoff, H. G. (2019). IJTAG Compatible Timing Monitor with Robust Self-Calibration for Environmental and Aging Variation. In Proceedings - 2019 IEEE European Test Symposium, ETS 2019 (pp. 1-6). Article 8791539 (Proceedings of the European Test Workshop (ETS); Vol. 2019). IEEE. https://doi.org/10.1109/ETS.2019.8791539

Ali, G. , Pathrose Vareed, J. , & Kerkhoff, H. G. (2019). IJTAG Compatible Delay-line based Voltage Embedded Instrument with One Clock-cycle Conversion Time. In 2019 IEEE Latin American Test Symposium (LATS) Article 8704570 https://doi.org/10.1109/LATW.2019.8704570

Pathrose Vareed, J. , Ali, G. , & Kerkhoff, H. G. (2019). Enhancing Physical Unclonable Function Robustness Employing Embedded Instruments. In 2018 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) (pp. 370-373). Article 8605571 IEEE. https://doi.org/10.1109/APCCAS.2018.8605571

Ali, G. , Pathrose Vareed, J. , & Kerkhoff, H. G. (2018). On‐Chip Lifetime Prediction for Dependable Many‐Processor SoCs based on Data Fusion. In 2018 IEEE 12th International Symposium on Embedded Multicore/Many-core Systems-on-Chip (MCSoC) (pp. 44-51) Advance online publication. https://doi.org/10.1109/MCSoC2018.2018.00019

Ali, G., Ebrahimi, H. , Pathrose Vareed, J. , & Kerkhoff, H. G. (2018). Design and Implementation of a Dependable CPSoC for Automotive Applications. In 2018 IEEE Industrial Cyber-Physical Systems (ICPS) (pp. 246-251) Advance online publication. https://doi.org/10.1109/ICPHYS.2018.8387667

Pathrose Vareed, J. , Ali, G. , & Kerkhoff, H. G. (2018). IJTAG compatible analogue embedded instruments for MPSoC life-time prediction. In 2018 IEEE 19th Latin-American Test Symposium (LATS) (pp. 1-4) https://doi.org/10.1109/LATW.2018.8349691