Welkom...

prof.dr. J. Schmitz (Jurriaan)

Hoogleraar

Expertises

Physics & Astronomy
Chips
Cmos
Detectors
Engineering & Materials Science
Atomic Layer Deposition
Detectors
Hot Carriers
Silicon
Tungsten

Publicaties

Recent
van Wijngaarden, B., Yang, J. , & Schmitz, J. (2022). Inaccuracies in contact resistivity from the Cox–Strack method: A review. Solar Energy Materials and Solar Cells, 246, 1-8. [111909]. https://doi.org/10.1016/j.solmat.2022.111909
Kettle, J., Aghaei, M., Ahmad, S., Fairbrother, A., Irvine, S., Jacobsson, J., Kazim, S., Kazukauskas, V., Lamb, D., Lobato, K., Mousdis, G. E. O. R. G. I. O. S., Oreski, G. , Reinders, A. , Schmitz, J. , Yilmaz, P., & Theelen, M. (Accepted/In press). Review of technology-specific degradation in c-Si, CdTe, CIGS, dye sensitised, organic and perovskite solar cells in photovoltaic modules: Understanding how reliability improvements in mature technologies can enhance emerging technologies. Progress in Photovoltaics: Research and Applications. https://doi.org/10.1002/pip.3577
Yilmaz, P., Aninat, R., Cruz, G. O., Weber, T. , Schmitz, J., & Theelen, M. (2022). Post-mortem analysis of a commercial Copper Indium Gallium Diselenide (CIGS) photovoltaic module after potential induced degradation. Progress in Photovoltaics: Research and Applications, 30(6), 640-647. https://doi.org/10.1002/pip.3538
Aghaei, M., Fairbrother, A., Gok, A., Kazim, S., Lobato, K., Oreski, G. , Reinders, A. , Schmitz, J., Theelen, M. , Yilmaz, P., & Kettle, J. (2022). Review of degradation and failure phenomena in photovoltaic modules. Renewable and Sustainable Energy Reviews, 159, [112160]. https://doi.org/10.1016/j.rser.2022.112160
Yilmaz, P. , Schmitz, J., & Theelen, M. (2022). Potential induced degradation of CIGS PV systems: A literature review. Renewable and Sustainable Energy Reviews, 154, [111819]. https://doi.org/10.1016/j.rser.2021.111819
Vermeer, M. L. , Hueting, R. J. E., Pirro, L., Hoentschel, J. , & Schmitz, J. (2021). Interface States Characterization of UTB SOI MOSFETs From the Subthreshold Current. IEEE Transactions on Electron Devices, 68(2), 497-502. [9305941]. https://doi.org/10.1109/TED.2020.3043223
De Jong, M. J. , Salm, C. , & Schmitz, J. (2020). Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings [9129540] (IEEE International Reliability Physics Symposium Proceedings; Vol. 2020-April). IEEE. https://doi.org/10.1109/IRPS45951.2020.9129540
Liakopoulou, A. , Annema, A. J., Bortot, L., Charifoulline, Z., MacIejewski, M., Prioli, M. , Ravaioli, E. , Salm, C. , Schmitz, J. , & Verweij, A. P. (2020). Analysis of short-circuit transients in the LHC main dipole circuit. Journal of physics: Conference series, 1559(1), [012077]. https://doi.org/10.1088/1742-6596/1559/1/012077
Smink, A. E. M. , de Jong, M. J. , Hilgenkamp, H. , Van Der Wiel, W. G. , & Schmitz, J. (2020). Anomalous Scaling of Parasitic Capacitance in FETs with a High-K Channel Material. In 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) [9107901] (IEEE International Conference on Microelectronic Test Structures; Vol. 2020). IEEE. https://doi.org/10.1109/ICMTS48187.2020.9107901
van Rijnbach, M. , Hueting, R. J. E., Stodolny, M., Janssen, G., Melskens, J. , & Schmitz, J. (2020). On the Accuracy of the Cox-Strack Equation and Method for Contact Resistivity Determination. IEEE Transactions on Electron Devices, 67(4), 1757-1763. [9031713]. https://doi.org/10.1109/TED.2020.2974194
ten Veldhuis, M-C., Uijlenhoet, R. , Schmitz, J., Smolders, B. , Nauta, B., Baltus, P., Makinwa, K., & Steeneken, P. (2019). Plantenna: towards a network of vegetation-integrated sensors for plant and environmental monitoring. Abstract from EGU General Assembly 2019, Vienna, Austria.
Liakopoulou, A. , Annema, A. J., Bortot, L., Charifoulline, Z., Maciejewski, M., Prioli, M. , Ravaioli, E. , Salm, C. , Schmitz, J. , & Verweij, A. P. (2019). Analysis of Short-Circuit Transients in the LHC Main Dipole Circuit. Abstract from 14th European Conference on Applied Superconductivity, EUCAS 2019, Glasgow, United Kingdom.
van der Zouw, K. , Aarnink, A. A. I. , Schmitz, J. , & Kovalgin, A. Y. (2019). Electrical characterization of hot-wire assisted atomic layer deposited Tungsten films. In 2019 IEEE 32nd International Conference on Microelectronic Test Structures, ICMTS 2019 (pp. 48-53). [8730954] IEEE. https://doi.org/10.1109/ICMTS.2019.8730954
Agarwal, V. , Dutta, S. , Annema, A. J. , Hueting, R. J. E. , Schmitz, J., Lee, M-J., Charbon, E. , & Nauta, B. (2018). Optocoupling in CMOS. In 2018 IEEE International Electron Devices Meeting (IEDM) IEEE. https://doi.org/10.1109/IEDM.2018.8614523
Puliyankot, V., Piccolo, G. , Hueting, R. J. E. , & Schmitz, J. (2018). Toward GHz Switching in SOI Light Emitting Diodes. IEEE Transactions on Electron Devices, 65(10), 4413-4420. [8457503]. https://doi.org/10.1109/TED.2018.2866517

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Vakken Collegejaar  2022/2023

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Vakken Collegejaar  2021/2022

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Bezoekadres

Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré (gebouwnr. 15), kamer C2617
Hallenweg 23
7522NH  Enschede

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Postadres

Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré  C2617
Postbus 217
7500 AE Enschede

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