Carré

prof.dr. J. Schmitz (Jurriaan)

Hoogleraar
EEMCS-EE-IDS
Carré C2617
j.schmitz@utwente.nl
+31534895767
Visitekaartje

Expertises

  • Material Science

    • Temperature
    • Devices
    • Tungsten
    • Metal
    • Electrical Resistivity

  • Physics

    • Electric Potential
    • Silicon
    • Wafer

Organisaties

Publicaties

Jump to: 2024 | 2023 | 2022 | 2021 | 2020

2024

Advances in 2D Anemometry (2024)[Contribution to conference › Poster] IEEE SENSORS 2024. Hackett, T. L., Sanders, R. G. P., Choi, J. Y., Džemaili, N., Winnen, V., van den Berg, T. E., Alveringh, D. & Schmitz, J.Design Parameter Comparison for a Silicon-based Directional Low Drift Thermal Anemometer for Horticultural Applications (2024)[Contribution to conference › Abstract] 50th International Micro and Nano Engineering Conference, MNE 2024. Hackett, T., Sanders, R. G. P., Alveringh, D. & Schmitz, J.A Machine Learning Enhanced MEMS Thermal Anemometer for Detection of Flow, Angle of Attack, and Relative Humidity (2024)IEEE Sensors Letters, 8(7). Article 6008304. Hackett, T., Sanders, R. G. P., Schmitz, J., Alveringh, D., van den Berg, T. E. & Choi, J. Y.https://doi.org/10.1109/LSENS.2024.3418193Viewing stomata in action: Autonomous in planta imaging of individual stomatal movement links morphology and kinetics (2024)[Working paper › Preprint]. bioRxiv. Berg, T. E. v. d., Sanders, R. G. P., Kaiser, E. & Schmitz, J.https://doi.org/10.1101/2024.03.13.584774A Multi-Parameter measurement system for MEMS Anemometers for Data Collection with Machine Learning Outcomes (2024)[Contribution to conference › Poster] 5th Conference on MicroFluidic Handling Systems, MFHS 2024. Hackett, T. L., Sanders, R. G. P., van den Berg, T. E., Alveringh, D. & Schmitz, J.A Multi-Parameter Measurement System for MEMS Anemoters for Data Collection with Machine Learning Outcomes (2024)[Contribution to conference › Paper] 5th Conference on MicroFluidic Handling Systems, MFHS 2024. Hackett, T., Alveringh, D., Sanders, R. G. P., van den Berg, T. E. & Schmitz, J.

2023

Fluid classification with integrated flow and pressure sensors using machine learning (2023)Sensors and Actuators A: Physical, 363. Article 114762. Alveringh, D., Le, D. V., Groenesteijn, J., Schmitz, J. & Lötters, J. C.https://doi.org/10.1016/j.sna.2023.114762Characterisation of Photodiodes in 22 nm FDSOI at 850 nm (2023)In ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) (pp. 65-68). IEEE. Bakker, J. H. T., Oude Alink, M. S., Schmitz, J. & Nauta, B.https://doi.org/10.1109/ESSDERC59256.2023.10268483Thermal Resistivity of FFF Printed Carbon Black Doped Polymers (2023)In 2023 IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS). IEEE. Jonkers, H., Kosmas, D., Schmitz, J. & Krijnen, G.https://doi.org/10.1109/FLEPS57599.2023.10220388Corrigendum to “Inaccuracies in contact resistivity from the Cox–Strack method: A review” [Sol. Energy Mater. Sol. Cells 246 (2022) 111909] (2023)Solar Energy Materials and Solar Cells, 254. Article 112254. van Wijngaarden, B., Yang, J. & Schmitz, J.https://doi.org/10.1016/j.solmat.2023.112254In-depth analysis of potential-induced degradation in a commercial CIGS PV module (2023)Progress in Photovoltaics, 31(6). Yilmaz, P., de Wild, J., Aninat, R., Weber, T., Vermang, B., Schmitz, J. & Theelen, M.https://doi.org/10.1002/pip.3670The world of chips: How do you make chips? (2023)[Non-textual form › Digital or Visual Products]. Ackermann, M., Nauta, B. & Schmitz, J.https://www.utwente.nl/nl/sg/programma/2023/3/386762/de-wereld-van-chips?code=4abdccddPerformance and Degradation in Silicon PV Systems Under Outdoor Conditions in Relation to Reliability Aspects of Silicon PV Modules - Summary of Results of COST Action PEARL PV (2023)In 2023 IEEE 50th Photovoltaic Specialists Conference, PVSC 2023. IEEE. Lindig, S., Ascencio-Vásquez, J., Leloux, J., Moser, D., Aghaei, M., Fairbrother, A., Gok, A., Ahmad, S., Kazim, S., Lobato, K., Van Sark, W. J. G. H. M., Pearsall, N., Burduhos, B. G., Raghoebarsing, A., Oreski, G., Schmitz, J., Theelen, M., Yilmaz, P., Kettle, J. & Reinders, A. H. M. E.https://doi.org/10.1109/PVSC48320.2023.10359742

2022

Review of technology specific degradation in crystalline silicon, cadmium telluride, copper indium gallium selenide, dye sensitised, organic and perovskite solar cells in photovoltaic modules: Understanding how reliability improvements in mature technologies can enhance emerging technologies (2022)Progress in Photovoltaics, 30(12), 1365-1392. Kettle, J., Aghaei, m., Ahmad, S., Fairbrother, A., Irvine, S., Jacobsson, J., Kazim, S., Kazukauskas, V., Lamb, D., Lobato, K., Mousdis, G. E. O. R. G. I. O. S., Oreski, G., Reinders, A., Schmitz, J., Yilmaz, P. & Theelen, M.https://doi.org/10.1002/pip.3577Inaccuracies in contact resistivity from the Cox–Strack method: A review (2022)Solar Energy Materials and Solar Cells, 246, 1-8. Article 111909. van Wijngaarden, B., Yang, J. & Schmitz, J.https://doi.org/10.1016/j.solmat.2022.111909Post-mortem analysis of a commercial Copper Indium Gallium Diselenide (CIGS) photovoltaic module after potential induced degradation (2022)Progress in Photovoltaics, 30(6), 640-647. Yilmaz, P., Aninat, R., Cruz, G. O., Weber, T., Schmitz, J. & Theelen, M.https://doi.org/10.1002/pip.3538Review of degradation and failure phenomena in photovoltaic modules (2022)Renewable & sustainable energy reviews, 159. Article 112160. Aghaei, M., Fairbrother, A., Gok, A., Kazim, S., Lobato, K., Oreski, G., Reinders, A., Schmitz, J., Theelen, M., Yilmaz, P. & Kettle, J.https://doi.org/10.1016/j.rser.2022.112160Potential induced degradation of CIGS PV systems: A literature review (2022)Renewable & sustainable energy reviews, 154. Article 111819. Yilmaz, P., Schmitz, J. & Theelen, M.https://doi.org/10.1016/j.rser.2021.111819Recovery of hot-carrier degraded nMOSFETs (2022)[Thesis › PhD Thesis - Research UT, graduation UT]. University of Twente. de Jong, M. J.https://doi.org/10.3990/1.9789036553438

2021

Low temperature pure boron layer deposition for silicon diode and micromachining applications (2021)[Thesis › PhD Thesis - Research UT, graduation UT]. University of Twente. Liu, X.https://doi.org/10.3990/1.9789036552547Interface States Characterization of UTB SOI MOSFETs From the Subthreshold Current (2021)IEEE Transactions on Electron Devices, 68(2), 497-502. Article 9305941. Vermeer, M. L., Hueting, R. J. E., Pirro, L., Hoentschel, J. & Schmitz, J.https://doi.org/10.1109/TED.2020.3043223

2020

Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices (2020)In 2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings. Article 9129540 (IEEE International Reliability Physics Symposium Proceedings; Vol. 2020-April). IEEE. De Jong, M. J., Salm, C. & Schmitz, J.https://doi.org/10.1109/IRPS45951.2020.9129540Analysis of short-circuit transients in the LHC main dipole circuit (2020)Journal of physics: Conference series, 1559(1). Article 012077. Liakopoulou, A., Annema, A. J., Bortot, L., Charifoulline, Z., MacIejewski, M., Prioli, M., Ravaioli, E., Salm, C., Schmitz, J. & Verweij, A. P.https://doi.org/10.1088/1742-6596/1559/1/012077Towards electrostatic doping approaches in ultra-thin body semiconductor materials and devices (2020)[Thesis › PhD Thesis - Research UT, graduation UT]. University of Twente. Gupta, G.https://doi.org/10.3990/1.9789036550185Anomalous Scaling of Parasitic Capacitance in FETs with a High-K Channel Material (2020)In 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS). Article 9107901 (IEEE International Conference on Microelectronic Test Structures; Vol. 2020). IEEE. Smink, A. E. M., de Jong, M. J., Hilgenkamp, H., Van Der Wiel, W. G. & Schmitz, J.https://doi.org/10.1109/ICMTS48187.2020.9107901

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