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prof.dr. J. Schmitz (Jurriaan)

Hoogleraar

Expertises

Silicon
Cmos
Thin Films
Light Emitting Diodes
Temperature
Metals
Metals
Tungsten
Thin Films
Tungsten
Atomic Layer Deposition
Wire
Wire
Degradation
Thin Films
Atomic Layer Deposition
Degradation
Light Emitting Diodes
Light Emitting Diodes

Publicaties

Recent
Puliyankot, V., Piccolo, G., Hueting, R. J. E., & Schmitz, J. (2018). Towards GHz Switching in SOI Light Emitting Diodes. IEEE transactions on electron devices. DOI: 10.1109/TED.2018.2866517
Çiftpinar, H. E., Stodolny, M. K., Wu, Y., Janssen, G. J. M., Löffler, J., Schmitz, J., ... Geerligs, B. L. J. (2017). Study of screen printed metallization for polysilicon based passivating contacts. Energy procedia, 124, 851-861. DOI: 10.1016/j.egypro.2017.09.242
Stodolny, M. K., Anker, J., Geerligs, B. L. J., Janssen, G. J. M., van de Loo, B. W. H., Melskens, J., ... Romijn, I. (2017). Material properties of LPCVD processed n-type polysilicon passivating contacts and its application in PERPoly industrial bifacial solar cells. Energy procedia, 124, 635-642. DOI: 10.1016/j.egypro.2017.09.250
Dutta, S., Orbe, L., & Schmitz, J. (2017). TCAD analysis of wide-spectrum waveguide in high-voltage SOI CMOS. Paper presented at 17th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2017, Copenhagen, Denmark.DOI: 10.1109/NUSOD.2017.8009969
Banerjee, S., van der Velde, F. J., Yang, M., Schmitz, J., & Kovalgin, A. Y. (2017). Electrical test structures for verifying continuity of ultra-thin insulating and conducting films. In Electrical test structures for verifying continuity of ultra-thin insulating and conducting films (pp. 1-6). New York: IEEE. DOI: 10.1109/ICMTS.2017.7954258
Dutta, S., Steeneken, P. G., Agarwal, V. V., Schmitz, J., Annema, A. J., & Hueting, R. J. E. (2017). The avalanche-mode superjunction LED. IEEE transactions on electron devices, 64(4), 1612-1618. DOI: 10.1109/TED.2017.2669645
Schmitz, J. (2017). Prospects of efficient band-to-band emission in silicon LEDs. In M. du Plessis (Ed.), Fourth Conference on Sensors, MEMS, and Electro-Optic Systems: 18–20 September 2016, Skukuza, Kruger National Park, South Africa (pp. 2-7). (Proceedings of SPIE; Vol. 10036). SPIE. DOI: 10.1117/12.2245589
Schmitz, J., Nauta, B., & Seijlhouwer, M. (2016). Meer More. Ingenieur, 128(8), 30-33.
Grasser, T., Schmitz, J., & Lemme, M. C. (2016). Editorial: Extended papers selected from ESSDERC 2015. Solid-state electronics, 125, 1-1. DOI: 10.1016/j.sse.2016.09.018

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Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Carré (gebouwnr. 15), kamer C2617
Hallenweg 23
7522NH  Enschede

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Postadres

Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Carré  C2617
Postbus 217
7500 AE Enschede

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