Expertises
Physics & Astronomy
# Chips
# Cmos
# Detectors
Engineering & Materials Science
# Atomic Layer Deposition
# Detectors
# Hot Carriers
# Silicon
# Tungsten
Verbonden aan
Publicaties
Recent
Ackermann, M. (Author)
, Nauta, B. (Author)
, & Schmitz, J. (Author). (2023).
The world of chips: How do you make chips? . Digital or Visual Products, .
https://www.utwente.nl/nl/sg/programma/2023/3/386762/de-wereld-van-chips?code=4abdccdd
van Wijngaarden, B., Yang, J.
, & Schmitz, J. (2023).
Corrigendum to “Inaccuracies in contact resistivity from the Cox–Strack method: A review” [Sol. Energy Mater. Sol. Cells 246 (2022) 111909].
Solar Energy Materials and Solar Cells,
254, [112254].
https://doi.org/10.1016/j.solmat.2023.112254
Yilmaz, P., de Wild, J., Aninat, R., Weber, T., Vermang, B.
, Schmitz, J., & Theelen, M. (2023).
In-depth analysis of potential-induced degradation in a commercial CIGS PV module.
Progress in Photovoltaics: Research and Applications.
https://doi.org/10.1002/pip.3670
van Wijngaarden, B., Yang, J.
, & Schmitz, J. (2022).
Inaccuracies in contact resistivity from the Cox–Strack method: A review.
Solar Energy Materials and Solar Cells,
246, 1-8. [111909].
https://doi.org/10.1016/j.solmat.2022.111909
Kettle, J., Aghaei, M., Ahmad, S., Fairbrother, A., Irvine, S., Jacobsson, J., Kazim, S., Kazukauskas, V., Lamb, D., Lobato, K., Mousdis, G. E. O. R. G. I. O. S., Oreski, G.
, Reinders, A.
, Schmitz, J., Yilmaz, P., & Theelen, M. (2022).
Review of technology specific degradation in crystalline silicon, cadmium telluride, copper indium gallium selenide, dye sensitised, organic and perovskite solar cells in photovoltaic modules: Understanding how reliability improvements in mature technologies can enhance emerging technologies.
Progress in Photovoltaics: Research and Applications,
30(12), 1365-1392.
https://doi.org/10.1002/pip.3577
de Jong, M. J. (2022).
Recovery of hot-carrier degraded nMOSFETs. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente.
https://doi.org/10.3990/1.9789036553438
Yilmaz, P., Aninat, R., Cruz, G. O., Weber, T.
, Schmitz, J., & Theelen, M. (2022).
Post-mortem analysis of a commercial Copper Indium Gallium Diselenide (CIGS) photovoltaic module after potential induced degradation.
Progress in Photovoltaics: Research and Applications,
30(6), 640-647.
https://doi.org/10.1002/pip.3538
Aghaei, M., Fairbrother, A., Gok, A., Kazim, S., Lobato, K., Oreski, G.
, Reinders, A.
, Schmitz, J., Theelen, M., Yilmaz, P., & Kettle, J. (2022).
Review of degradation and failure phenomena in photovoltaic modules.
Renewable and Sustainable Energy Reviews,
159, [112160].
https://doi.org/10.1016/j.rser.2022.112160
Yilmaz, P.
, Schmitz, J., & Theelen, M. (2022).
Potential induced degradation of CIGS PV systems: A literature review.
Renewable and Sustainable Energy Reviews,
154, [111819].
https://doi.org/10.1016/j.rser.2021.111819
Liu, X. (2021).
Low temperature pure boron layer deposition for silicon diode and micromachining applications. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente.
https://doi.org/10.3990/1.9789036552547
Vermeer, M. L.
, Hueting, R. J. E., Pirro, L., Hoentschel, J.
, & Schmitz, J. (2021).
Interface States Characterization of UTB SOI MOSFETs From the Subthreshold Current.
IEEE Transactions on Electron Devices,
68(2), 497-502. [9305941].
https://doi.org/10.1109/TED.2020.3043223
De Jong, M. J.
, Salm, C.
, & Schmitz, J. (2020).
Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices. In
2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings [9129540] (IEEE International Reliability Physics Symposium Proceedings; Vol. 2020-April). IEEE.
https://doi.org/10.1109/IRPS45951.2020.9129540
Liakopoulou, A.
, Annema, A. J., Bortot, L., Charifoulline, Z., MacIejewski, M., Prioli, M.
, Ravaioli, E.
, Salm, C.
, Schmitz, J.
, & Verweij, A. P. (2020).
Analysis of short-circuit transients in the LHC main dipole circuit.
Journal of physics: Conference series,
1559(1), [012077].
https://doi.org/10.1088/1742-6596/1559/1/012077
Smink, A. E. M.
, de Jong, M. J.
, Hilgenkamp, H.
, Van Der Wiel, W. G.
, & Schmitz, J. (2020).
Anomalous Scaling of Parasitic Capacitance in FETs with a High-K Channel Material. In
2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) [9107901] (IEEE International Conference on Microelectronic Test Structures; Vol. 2020). IEEE.
https://doi.org/10.1109/ICMTS48187.2020.9107901
Gupta, G. (2020).
Towards electrostatic doping approaches in ultra-thin body semiconductor materials and devices. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente.
https://doi.org/10.3990/1.9789036550185
van der Zouw, K.
, Aarnink, A. A. I.
, Schmitz, J.
, & Kovalgin, A. Y. (2020).
Conduction and electric field effect in ultra-thin tungsten films.
IEEE Transactions on Semiconductor Manufacturing,
33(2), 202-209. [9016070].
https://doi.org/10.1109/TSM.2020.2976886
van Rijnbach, M.
, Hueting, R. J. E., Stodolny, M., Janssen, G., Melskens, J.
, & Schmitz, J. (2020).
On the Accuracy of the Cox-Strack Equation and Method for Contact Resistivity Determination.
IEEE Transactions on Electron Devices,
67(4), 1757-1763. [9031713].
https://doi.org/10.1109/TED.2020.2974194
Ozturk, E.
, Dikkers, M. J.
, Batenburg, K. M.
, Salm, C.
, & Schmitz, J. (2020).
RFID Tag Failure after Thermal Overstress. In
2019 IEEE International Integrated Reliability Workshop, IIRW 2019 [8989885] IEEE.
https://doi.org/10.1109/IIRW47491.2019.8989885
Onnink, A. J.
, Apaydin, R. O.
, Schmitz, J.
, & Kovalgin, A. Y. (2019).
In-situ study of ammonium bromide formation for optimizing boron nitride ALD from BBr3 and NH3. Abstract from EuroCVD 22 Baltic ALD 16 |2019, Luxembourg, Luxembourg.
ten Veldhuis, M-C., Uijlenhoet, R.
, Schmitz, J., Smolders, B.
, Nauta, B., Baltus, P., Makinwa, K., & Steeneken, P. (2019).
Plantenna: towards a network of vegetation-integrated sensors for plant and environmental monitoring. Abstract from EGU General Assembly 2019, Vienna, Austria.
Liakopoulou, A.
, Annema, A. J., Bortot, L., Charifoulline, Z., Maciejewski, M., Prioli, M.
, Ravaioli, E.
, Salm, C.
, Schmitz, J.
, & Verweij, A. P. (2019).
Analysis of Short-Circuit Transients in the LHC Main Dipole Circuit. Abstract from 14th European Conference on Applied Superconductivity, EUCAS 2019, Glasgow, United Kingdom.
de Jong, M. J.
, Salm, C.
, & Schmitz, J. (2019).
Recovery after hot-carrier injection: Slow versus fast traps.
Microelectronics reliability,
100-101, [113318].
https://doi.org/10.1016/j.microrel.2019.06.010
van der Zouw, K.
, Aarnink, A. A. I.
, Schmitz, J.
, & Kovalgin, A. Y. (2019).
Electrical characterization of hot-wire assisted atomic layer deposited Tungsten films. In
2019 IEEE 32nd International Conference on Microelectronic Test Structures, ICMTS 2019 (pp. 48-53). [8730954] IEEE.
https://doi.org/10.1109/ICMTS.2019.8730954
de Jong, M. J.
, Salm, C.
, & Schmitz, J. (2018).
Towards understanding recovery of hot-carrier induced degradation.
Microelectronics reliability,
88-90, 147-151.
https://doi.org/10.1016/j.microrel.2018.07.057
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Vakken Collegejaar 2022/2023
Vakken in het huidig collegejaar worden toegevoegd op het moment dat zij definitief zijn in het Osiris systeem. Daarom kan het zijn dat de lijst nog niet compleet is voor het gehele collegejaar.
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Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré
(gebouwnr. 15), kamer C2617
Hallenweg 23
7522NH Enschede
Postadres
Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré
C2617
Postbus 217
7500 AE Enschede