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prof.dr. J. Schmitz (Jurriaan)

Hoogleraar

Expertises

Silicon
Temperature
Detectors
Silicon
Metals
Fabrication
Capacitance
Oxides

Publicaties

Recente Artikelen
Çiftpinar, H. E., Stodolny, M. K., Wu, Y., Janssen, G. J. M., Löffler, J., Schmitz, J., ... Geerligs, B. L. J. (2017). Study of screen printed metallization for polysilicon based passivating contacts. Energy procedia, 124, 851-861. DOI: 10.1016/j.egypro.2017.09.242
Stodolny, M. K., Anker, J., Geerligs, B. L. J., Janssen, G. J. M., van de Loo, B. W. H., Melskens, J., ... Romijn, I. (2017). Material properties of LPCVD processed n-type polysilicon passivating contacts and its application in PERPoly industrial bifacial solar cells. Energy procedia, 124, 635-642. DOI: 10.1016/j.egypro.2017.09.250
Dutta, S., Orbe, L., & Schmitz, J. (2017). TCAD analysis of wide-spectrum waveguide in high-voltage SOI CMOS. Paper presented at Numerical simulation of optoelectronic devices 2017, Copenhagen, Denmark.DOI: 10.1109/NUSOD.2017.8009969
Banerjee, S., van der Velde, F. J., Yang, M., Schmitz, J., & Kovalgin, A. Y. (2017). Electrical test structures for verifying continuity of ultra-thin insulating and conducting films. In Electrical test structures for verifying continuity of ultra-thin insulating and conducting films (pp. 1-6). New York: IEEE. DOI: 10.1109/ICMTS.2017.7954258
Dutta, S., Steeneken, P. G., Agarwal, V. V., Schmitz, J., Annema, A. J., & Hueting, R. J. E. (2017). The avalanche-mode superjunction LED. IEEE transactions on electron devices, 64(4), 1612-1618. DOI: 10.1109/TED.2017.2669645
Schmitz, J. (2017). Prospects of efficient band-to-band emission in silicon LEDs. In M. du Plessis (Ed.), Fourth Conference on Sensors, MEMS, and Electro-Optic Systems: 18–20 September 2016, Skukuza, Kruger National Park, South Africa (pp. 2-7). (Proceedings of SPIE; Vol. 10036). SPIE. DOI: 10.1117/12.2245589
Schmitz, J., Nauta, B., & Seijlhouwer, M. (2016). Meer More. Ingenieur, 128(8), 30-33.
Grasser, T., Schmitz, J., & Lemme, M. C. (2016). Editorial: Extended papers selected from ESSDERC 2015. Solid-state electronics, 125, 1-1. DOI: 10.1016/j.sse.2016.09.018
Schmitz, J., Kaleli, B., Kuipers, P., van den Berg, N., Smits, S. M., & Hueting, R. J. E. (2016). Interface trap density estimation in FinFETs from the subthreshold current. In 2016 International Conference on Microelectronic Test Structures (ICMTS) (pp. 164-167). (Proceedings Conference ICMTS). USA: IEEE. DOI: 10.1109/ICMTS.2016.7476199
Wang, J., Bielen, J., Salm, C., & Schmitz, J. (2016). Spring-constant measurement methods for RF-MEMS capacitive switches. In 2016 International Conference on Microelectronic Test Structures (ICMTS) (pp. 10-14). USA: IEEE. DOI: 10.1109/ICMTS.2016.7476164

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Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Carré (gebouwnr. 15), kamer 2617
Hallenweg 23
7522NH  Enschede

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Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Carré  2617
Postbus 217
7500 AE Enschede

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