Welkom...

prof.dr. J. Schmitz (Jurriaan)

Hoogleraar

Expertises

Physics & Astronomy
Chips
Cmos
Detectors
Engineering & Materials Science
Atomic Layer Deposition
Detectors
Hot Carriers
Silicon
Tungsten

Publicaties

Recent
Yilmaz, P., Aninat, R., Cruz, G. O., Weber, T. , Schmitz, J., & Theelen, M. (2022). Post-mortem analysis of a commercial Copper Indium Gallium Diselenide (CIGS) photovoltaic module after potential induced degradation. Progress in Photovoltaics: Research and Applications, 30(6), 640-647. https://doi.org/10.1002/pip.3538
Aghaei, M., Fairbrother, A., Gok, A., Kazim, S., Lobato, K., Oreski, G. , Reinders, A. , Schmitz, J., Theelen, M. , Yilmaz, P., & Kettle, J. (2022). Review of degradation and failure phenomena in photovoltaic modules. Renewable and Sustainable Energy Reviews, 159, [112160]. https://doi.org/10.1016/j.rser.2022.112160
Yilmaz, P. , Schmitz, J., & Theelen, M. (2022). Potential induced degradation of CIGS PV systems: A literature review. Renewable and Sustainable Energy Reviews, 154, [111819]. https://doi.org/10.1016/j.rser.2021.111819
Vermeer, M. L. , Hueting, R. J. E., Pirro, L., Hoentschel, J. , & Schmitz, J. (2021). Interface States Characterization of UTB SOI MOSFETs From the Subthreshold Current. IEEE Transactions on Electron Devices, 68(2), 497-502. [9305941]. https://doi.org/10.1109/TED.2020.3043223
De Jong, M. J. , Salm, C. , & Schmitz, J. (2020). Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings [9129540] (IEEE International Reliability Physics Symposium Proceedings; Vol. 2020-April). IEEE. https://doi.org/10.1109/IRPS45951.2020.9129540
Liakopoulou, A. , Annema, A. J., Bortot, L., Charifoulline, Z., MacIejewski, M., Prioli, M. , Ravaioli, E. , Salm, C. , Schmitz, J. , & Verweij, A. P. (2020). Analysis of short-circuit transients in the LHC main dipole circuit. Journal of physics: Conference series, 1559(1), [012077]. https://doi.org/10.1088/1742-6596/1559/1/012077
Smink, A. E. M. , de Jong, M. J. , Hilgenkamp, H. , Van Der Wiel, W. G. , & Schmitz, J. (2020). Anomalous Scaling of Parasitic Capacitance in FETs with a High-K Channel Material. In 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) [9107901] (IEEE International Conference on Microelectronic Test Structures; Vol. 2020). IEEE. https://doi.org/10.1109/ICMTS48187.2020.9107901
van Rijnbach, M. , Hueting, R. J. E., Stodolny, M., Janssen, G., Melskens, J. , & Schmitz, J. (2020). On the Accuracy of the Cox-Strack Equation and Method for Contact Resistivity Determination. IEEE Transactions on Electron Devices, 67(4), 1757-1763. [9031713]. https://doi.org/10.1109/TED.2020.2974194
ten Veldhuis, M-C., Uijlenhoet, R. , Schmitz, J., Smolders, B. , Nauta, B., Baltus, P., Makinwa, K., & Steeneken, P. (2019). Plantenna: towards a network of vegetation-integrated sensors for plant and environmental monitoring. Abstract from EGU General Assembly 2019, Vienna, Austria.
Liakopoulou, A. , Annema, A. J., Bortot, L., Charifoulline, Z., Maciejewski, M., Prioli, M. , Ravaioli, E. , Salm, C. , Schmitz, J. , & Verweij, A. P. (2019). Analysis of Short-Circuit Transients in the LHC Main Dipole Circuit. Abstract from 14th European Conference on Applied Superconductivity, EUCAS 2019, Glasgow, United Kingdom.
Agarwal, V. , Dutta, S. , Annema, A. J. , Hueting, R. J. E. , Schmitz, J., Lee, M-J., Charbon, E. , & Nauta, B. (2018). Optocoupling in CMOS. In 2018 IEEE International Electron Devices Meeting (IEDM) IEEE. https://doi.org/10.1109/IEDM.2018.8614523
Puliyankot, V., Piccolo, G. , Hueting, R. J. E. , & Schmitz, J. (2018). Toward GHz Switching in SOI Light Emitting Diodes. IEEE Transactions on Electron Devices, 65(10), 4413-4420. [8457503]. https://doi.org/10.1109/TED.2018.2866517

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Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré (gebouwnr. 15), kamer C2617
Hallenweg 23
7522NH  Enschede

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Postadres

Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré  C2617
Postbus 217
7500 AE Enschede

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