Expertises

  • Material Science

    • Oxide
    • Electronics
    • Temperature
    • Heterojunction
    • Surface
  • Chemistry

    • Liquid Film
  • Physics

    • Thin Films
    • Electrons

Organisaties

Nevenwerkzaakheden

  • HFML-FELIX NijmegenMember Scientific Advisory Council
  • QSolid research program GermanyMember Scientific Advisory Council
  • FluxonicsBoard member

Publicaties

2024
The effect of intrinsic magnetic order on electrochemical water splittingApplied physics reviews, 11(1), Article 011420. van der Minne, E., Korol, L., Krakers, L. M. A., Verhage, M., Rosário, C. M. M., Roskamp, T. J., Spiteri, R. J., Biz, C., Fianchini, M., Boukamp, B. A., Rijnders, G., Flipse, K., Gracia, J., Mul, G., Hilgenkamp, H., Green, R. J., Koster, G. & Baeumer, C.https://doi.org/10.1063/5.0174662
2023
Multibridge VO2-Based Resistive Switching Devices in a Two-Terminal ConfigurationAdvanced electronic materials, 9(12), Article 2300304. Gao, X., Roskamp, T. J., Swoboda, T. P. E., Marques do Rosário, C. M., Smink, S., Muñoz Rojo, M. & Hilgenkamp, H.https://doi.org/10.1002/aelm.202300304Spatially-Resolved Thermometry of Filamentary Nanoscale Hot Spots in TiO2 Resistive Random Access Memories to Address Device VariabilityACS Applied Electronic Materials, 5(9), 5025-5031. Swoboda, T., Gao, X., Rosário, C. M. M., Hui, F., Zhu, K., Yuan, Y., Deshmukh, S., Köroǧlu, Ç., Pop, E., Lanza, M., Hilgenkamp, H. & Rojo, M. M.https://doi.org/10.1021/acsaelm.3c00782Imaging selective magnetic patterning of Ti/LaMnO3/SrTiO3 heterostructures using scanning SQUID microscopy. Roskamp, T. J., Folkers, B., Jansen, T., Gauquelin, N., Rosário, C. & Hilgenkamp, H.Utilizing the Insulator-to-Metal Transition of Vanadium Dioxide for Neuromorphic Computing. University of Twente. Gao, X.https://doi.org/10.3990/1.9789036557726Controlling ferromagnetism in LaMnO3/SrTiO3 thin films using Ti oxygen scavenging layers. Roskamp, T. J., Jansen, T., Folkers, B., Marques do Rosário, C. M. & Hilgenkamp, H.Controlling ferromagnetism in LaMnO3/SrTiO3 thin films using Ti oxygen scavenging layers. Roskamp, T. J., Jansen, T., Folkers, B., Marques do Rosário, C. M. & Hilgenkamp, H.Nanoscale temperature sensing of electronic devices with calibrated scanning thermal microscopyNanoscale, 15(15), 7139-7146. Swoboda, T., Wainstein, N., Deshmukh, S., Köroğlu, Ç., Gao, X., Lanza, M., Hilgenkamp, H., Pop, E., Yalon, E. & Muñoz Rojo, M.https://doi.org/10.1039/d3nr00343d
2022

Onderzoeksprofielen

Adres

Universiteit Twente

Carré (gebouwnr. 15), kamer C2063
Hallenweg 23
7522 NH Enschede

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