Expertises

  • Engineering

    • Sensor
    • Design
    • Microclimate
  • Physics

    • Diode
    • Fabrication
    • Detection
    • Boron
    • Light Emission

Organisaties

Publicaties

2024
2022
2021
2020
Diode design for studying material defect distributions with avalanche-mode light emissionIn 2020 IEEE 33rd International Conference on Microelectronic Test Structures, ICMTS 2020 - Proceedings, Article 9107933. IEEE. Krakers, M., Knezevic, T., Batenburg, K. M., Liu, X. & Nanver, L. K.https://doi.org/10.1109/ICMTS48187.2020.9107933RFID Tag Failure after Thermal OverstressIn 2019 IEEE International Integrated Reliability Workshop, IIRW 2019, Article 8989885. IEEE. Ozturk, E., Dikkers, M. J., Batenburg, K. M., Salm, C. & Schmitz, J.https://doi.org/10.1109/IIRW47491.2019.8989885

Onderzoeksprofielen

Adres

Universiteit Twente

Carré (gebouwnr. 15), kamer C2615
Hallenweg 23
7522 NH Enschede

Navigeer naar locatie

Organisaties

Scan de QR-code of
Download vCard