Welkom...

K.M. Batenburg BSc (Kevin)

Ondersteunend en beheerspersoneel

Expertises

Engineering & Materials Science
Boron
Chemical Vapor Deposition
Core Shell Nanoparticles
Diodes
Light Emission
Physical Vapor Deposition
Chemistry
Physical Vapour Deposition
Thermal Cycling

Publicaties

Recent
Krakers, M., Knezevic, T. , Batenburg, K. M. , Liu, X. , & Nanver, L. K. (2020). Diode design for studying material defect distributions with avalanche-mode light emission. In 2020 IEEE 33rd International Conference on Microelectronic Test Structures, ICMTS 2020 - Proceedings Article 9107933 (IEEE International Conference on Microelectronic Test Structures; Vol. 2020). IEEE. https://doi.org/10.1109/ICMTS48187.2020.9107933
Ozturk, E. , Dikkers, M. J. , Batenburg, K. M. , Salm, C. , & Schmitz, J. (2020). RFID Tag Failure after Thermal Overstress. In 2019 IEEE International Integrated Reliability Workshop, IIRW 2019 Article 8989885 IEEE. https://doi.org/10.1109/IIRW47491.2019.8989885

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Contactgegevens

Bezoekadres

Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré (gebouwnr. 15), kamer C2615
Hallenweg 21
7522NH  Enschede

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Postadres

Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré  C2615
Postbus 217
7500 AE Enschede