Expertises
Engineering & Materials Science
# Boron
# Chemical Vapor Deposition
# Core Shell Nanoparticles
# Diodes
# Light Emission
# Physical Vapor Deposition
Chemistry
# Physical Vapour Deposition
# Thermal Cycling
Verbonden aan
Publicaties
Recent
Alveringh, D., Bijsterveld, D. G., Berg, T. E. V. D.
, Veltkamp, H-W.
, Batenburg, K. M.
, Sanders, R. G. P.
, Lötters, J. C.
, & Wiegerink, R. J. (2022).
A miniature microclimate thermal flow sensor for horticultural applications. In
2022 IEEE Sensors Article 9967348 IEEE.
https://doi.org/10.1109/SENSORS52175.2022.9967348
Alveringh, D.
, van der Ven, D. L.
, Veltkamp, H-W.
, Batenburg, K. M.
, Sanders, R. G. P.
, Fernandez Rivas, D.
, & Wiegerink, R. J. (2022).
Miniature robust high-bandwidth force sensor with mechanically amplified piezoresistive readout. In
2022 IEEE 35th International Conference on Micro Electro Mechanical Systems Conference (MEMS) (pp. 684-687). IEEE.
https://doi.org/10.1109/MEMS51670.2022.9699639
Liu, S.
, de Beer, S.
, Batenburg, K. M.
, Gojzewski, H.
, Duvigneau, J.
, & Vancso, G. J. (2021).
Designer Core-Shell Nanoparticles as Polymer Foam Cell Nucleating Agents: The Impact of Molecularly Engineered Interfaces.
ACS Applied Materials and Interfaces,
13(14), 17034-17045.
https://doi.org/10.1021/acsami.1c00569
Thammaiah, S. D.
, Liu, X., Knežević, T.
, Batenburg, K. M.
, Aarnink, A. A. I.
, & Nanver, L. K. (2021).
PureB diode fabrication using physical or chemical vapor deposition methods for increased back-end-of-line accessibility.
Solid-state electronics,
177, Article 107938. Advance online publication.
https://doi.org/10.1016/j.sse.2020.107938
Krakers, M., Knezevic, T.
, Batenburg, K. M.
, Liu, X.
, & Nanver, L. K. (2020).
Diode design for studying material defect distributions with avalanche-mode light emission. In
2020 IEEE 33rd International Conference on Microelectronic Test Structures, ICMTS 2020 - Proceedings Article 9107933 (IEEE International Conference on Microelectronic Test Structures; Vol. 2020). IEEE.
https://doi.org/10.1109/ICMTS48187.2020.9107933
Ozturk, E.
, Dikkers, M. J.
, Batenburg, K. M.
, Salm, C.
, & Schmitz, J. (2020).
RFID Tag Failure after Thermal Overstress. In
2019 IEEE International Integrated Reliability Workshop, IIRW 2019 Article 8989885 IEEE.
https://doi.org/10.1109/IIRW47491.2019.8989885
Pure Link
Contactgegevens
Bezoekadres
Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré
(gebouwnr. 15), kamer C2615
Hallenweg 21
7522NH Enschede
Postadres
Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré
C2615
Postbus 217
7500 AE Enschede