University of Twente
Personen

Welkom...

dr.ir. L.J. Spreeuwers (Luuk)

Universitair hoofddocent

Expertises

Engineering & Materials Science
# Biometrics
# Cameras
# Classifiers
# Experiments
# Face Recognition
# Image Resolution
Business & Economics
# Face Recognition
# Likelihood Ratio

Verbonden aan

Publicaties

Recent
Lestriandoko, N. H. , Spreeuwers, L. , & Veldhuis, R. (2023). The Impact of Eyebrows Region on Deep Face Recognition. In 2023 10th International Conference on Computer, Control, Informatics and its Applications: Exploring the Power of Data: Leveraging Information to Drive Digital Innovation, IC3INA 2023 (pp. 319-323). IEEE. https://doi.org/10.1109/IC3INA60834.2023.10285734
Busch, C., Deravi, F., Frings, D., Kindt, E., Lessmann, R., Nouak, A., Salomon, J., Achcar, M., Alonso-Fernandez, F., Bachenheimer, D., Bethell, D., Bigun, J., Brawley, M., Brockmann, G., Cabello, E., Campisi, P., Cepilovs, A., Clee, M., Cohen, M., ... Uhl, A. (2023). Facilitating free travel in the Schengen area—A position paper by the European Association for Biometrics. IET biometrics, 12(2), 112-128. https://doi.org/10.1049/bme2.12107
Kelly, U. M. , Spreeuwers, L. , & Veldhuis, R. (2023). Exploring Face De-Identification using Latent Spaces. In 2022 IEEE International Joint Conference on Biometrics, IJCB 2022 (pp. 1-7). Article 10007990 (IEEE International Joint Conference on Biometrics (IJCB); Vol. 2022). IEEE. https://doi.org/10.1109/IJCB54206.2022.10007990
Kelly, U. M. , Spreeuwers, L. , & Veldhuis, R. N. J. (2022). Worst-Case Morphs: a Theoretical and a Practical Approach. In A. Bromme, N. Damer, M. Gomez-Barrero, K. Raja, C. Rathgeb, A. F. Sequeira, M. Todisco, & A. Uhl (Eds.), 2022 International Conference of the Biometrics Special Interest Group (BIOSIG) IEEE. https://doi.org/10.1109/BIOSIG55365.2022.9896965
Spek, M. V. D. , & Spreeuwers, L. (2022). Understanding and Modelling the Vascular Biometric Imaging Procedure. In A. Bromme, N. Damer, M. Gomez-Barrero, K. Raja, C. Rathgeb, A. F. Sequeira, M. Todisco, & A. Uhl (Eds.), 2022 International Conference of the Biometrics Special Interest Group (BIOSIG) IEEE. https://doi.org/10.1109/BIOSIG55365.2022.9897048
Ferla, R. , Spreeuwers, L. , & Zeinstra, C. G. (2022). Exploring the GANformer for Face Generation: Investigating the segmentation and smile augmentation potential. In Proceedings of the 2022 Symposium on Information Theory and Signal Processing in the Benelux (pp. 38)
Bunda, S. , Spreeuwers, L. , & Zeinstra, C. (2022). Sub-byte quantization of Mobile Face Recognition Convolutional Neural Networks. In 2022 International Conference of the Biometrics Special Interest Group (BIOSIG) (pp. 1-5). Article 9897025 (International Conference of the Biometrics Special Interest Group (BIOSIG); Vol. 2022). IEEE. https://doi.org/10.1109/BIOSIG55365.2022.9897025
de Wit, F. F. , Spreeuwers, L. , & Zeinstra, C. G. (2022). Biometric Testing: aligning standards and practice. 26-32. Paper presented at 42nd WIC Symposium on Information Theory and Signal Processing in the Benelux, SITB 2022, Louvain-la Neuve, Belgium.
Arican, T. , Veldhuis, R. , & Spreeuwers, L. (2022). Fingers Crossed: An Analysis of Cross-Device Finger Vein Recognition. In A. Bromme, N. Damer, M. Gomez-Barrero, K. Raja, C. Rathgeb, A. F. Sequeira, M. Todisco, & A. Uhl (Eds.), 2022 International Conference of the Biometrics Special Interest Group (BIOSIG) IEEE. https://doi.org/10.1109/BIOSIG55365.2022.9897029

Pure Link

Bekijk alle publicaties van deze medewerker

Google Scholar Link

Naar mijn profiel

Vakken Collegejaar  2023/2024

Vakken in het huidig collegejaar worden toegevoegd op het moment dat zij definitief zijn in het Osiris systeem. Daarom kan het zijn dat de lijst nog niet compleet is voor het gehele collegejaar.
 

Vakken Collegejaar  2022/2023

Contactgegevens

+31628371990  (mobiel)
+3153893453  (secretaresse)
+31534893453  (bij geen gehoor)
 
 

Bezoekadres

Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Zilverling (gebouwnr. 11), kamer 4067
Hallenweg 19
7522NH  Enschede

Navigeer naar locatie

Postadres

Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Zilverling  4067
Postbus 217
7500 AE Enschede

Verbonden aan

Universiteit Twente Drienerlolaan 5
7522 NB Enschede
+31 (0)53 489 9111
info@utwente.nl
Route