Expertises
Face Recognition
Biometrics
Experiments
Classifiers
Neural Networks
Lighting
Cameras
Detectors
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Publicaties
Recente Artikelen
Stoker, J. I., Windman, S. (Ed.), Garretsen, H., & Spreeuwers, L. J. (2016). The Facial Appearance of CEOs: Faces Signal Selection but Not Performance. PLoS ONE, 11(7), e0159950:1-11. [e0159950]. DOI: 10.1371/journal.pone.0159950
van Dam, C., Veldhuis, R. N. J., & Spreeuwers, L. J. (2016). Face reconstruction from image sequences for forensic face comparison. IET biometrics, 5(2), 140-146. DOI: 10.1049/iet-bmt.2015.0036
Kotzerke, J., Hao, H., Davis, S. A., Hayes, R., Spreeuwers, L. J., Veldhuis, R. N. J., & Horadam, K. J. (2016). Identification performance of evidential value estimation for ridge-based biometrics. EURASIP journal on information security, 2016(24), 1-10. DOI: 10.1186/s13635-016-0050-3
Susyanto, N., Veldhuis, R. N. J., Spreeuwers, L. J., & Klaassen, C. A. J. (2016). Two-step calibration method for multi-algorithm score-based face recognition systems by minimizing discrimination loss. 16252593. Paper presented at 9th IAPR International Conference on Biometrics, ICB 2016, Halmstad, Sweden.DOI: 10.1109/ICB.2016.7550094
Susyanto, N., Veldhuis, R. N. J., Spreeuwers, L. J., & Klaassen, C. A. J. (2016). Fixed FAR correction factor of score level fusion. 16555751. Paper presented at 2016 IEEE 8th International Conference on Biometrics Theory, Applications and Systems, BTAS 2016, Washington, United States.DOI: 10.1109/BTAS.2016.7791173
Dutta, A., Günther, M., El Shafey, L., Veldhuis, R. N. J., & Spreeuwers, L. J. (2015). Impact of eye detection error on face recognition performance. IET biometrics, 4(3), 137-150. DOI: 10.1049/iet-bmt.2014.0037
Spreeuwers, L. J. (2015). Setting a world record in 3D face recognition. Vonk : semi-wetenschappelijk maandblad van de ETSV Scintilla, 33(4), 11-21.
Ali, T., Spreeuwers, L. J., Veldhuis, R. N. J., & Meuwly, D. (2015). Sampling variability in forensic likelihood-ratio computation: A simulation study. Science & justice, 55(6), 499-508. DOI: 10.1016/j.scijus.2015.05.003
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Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Zilverling
(gebouwnr. 11), kamer 4122
Hallenweg 19
7522NH Enschede
Postadres
Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Zilverling
4122
Postbus 217
7500 AE Enschede