dr.ir. L.J. Spreeuwers (Luuk)

Universitair docent


Face Recognition
Parameter Estimation
Facial Recognition
Neural Networks
Image Quality


Zeinstra, C., Veldhuis, R., & Spreeuwers, L. (2018). Grid-Based Likelihood Ratio Classifiers for the Comparison of Facial Marks. IEEE transactions on information forensics and security, 13(1), 253-264. [8017453]. DOI: 10.1109/TIFS.2017.2746013
Zeinstra, C., Veldhuis, R., & Spreeuwers, L. (2017). How Random Is a Classifier Given Its Area under Curve? In A. Brömme, C. Busch, A. Dantcheva, C. Rathgeb, & A. Uhl (Eds.), 2017 International Conference of the Biometrics Special Interest Group (BIOSIG): BIOSIG 2017 [8053509] Gesellschaft fur Informatik (GI). DOI: 10.23919/BIOSIG.2017.8053509
Zeinstra, C., Veldhuis, R., Spreeuwers, L., & Ruifrok, A. (2017). Manually annotated characteristic descriptors: Measurability and variability. In 2017 5th International Workshop on Biometrics and Forensics (IWBF 2017) [7935095] Institute of Electrical and Electronics Engineers. DOI: 10.1109/IWBF.2017.7935095
Stoker, J. I., Windman, S. (Ed.), Garretsen, H., & Spreeuwers, L. J. (2016). The Facial Appearance of CEOs: Faces Signal Selection but Not Performance. PLoS ONE, 11(7), e0159950:1-11. [e0159950]. DOI: 10.1371/journal.pone.0159950
Kotzerke, J., Hao, H., Davis, S. A., Hayes, R., Spreeuwers, L. J., Veldhuis, R. N. J., & Horadam, K. J. (2016). Identification performance of evidential value estimation for ridge-based biometrics. EURASIP journal on information security, 2016(24), 1-10. DOI: 10.1186/s13635-016-0050-3
Susyanto, N., Veldhuis, R. N. J., Spreeuwers, L. J., & Klaassen, C. A. J. (2016). Two-step calibration method for multi-algorithm score-based face recognition systems by minimizing discrimination loss. 16252593. Paper presented at 9th IAPR International Conference on Biometrics, ICB 2016, Halmstad, Sweden.DOI: 10.1109/ICB.2016.7550094

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Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Zilverling (gebouwnr. 11), kamer 4122
Hallenweg 19
7522NH  Enschede

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Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Zilverling  4122
Postbus 217
7500 AE Enschede