Expertises
Engineering & Materials Science
# Biometrics
# Classifiers
# Deep Learning
# Face Recognition
# Feature Extraction
# Image Resolution
# Palmprint Recognition
Medicine & Life Sciences
# Deep Learning
Verbonden aan
Nevenactiviteiten
-
20Face
Advisor and shareholder 20Face -
EAB European Assiociation for Biometrics
Chair Academia SIG EAB -
NTNU
Professorship at another university
Publicaties
Recent
Liu, L., Ma, R., van Ooijen, P. M. A., Oudkerk, M., Vliegenthart, R.
, Veldhuis, R. N. J.
, & Brune, C. (2023).
The U-Net Family for Epicardial Adipose Tissue Segmentation and Quantification in Low-Dose CT.
Technologies,
11(4), [104].
https://doi.org/10.3390/technologies11040104
Ghafourian, M., Fierrez, J., Gomez, L. F., Vera-Rodriguez, R., Morales, A.
, Rezgui, Z.
, & Veldhuis, R. (2023).
Toward Face Biometric De-identification using Adversarial Examples. ArXiv.org.
https://doi.org/10.48550/arXiv.2302.03657
Veldhuis, R., & Raja, K. (2023).
On the Relation Between ROC and CMC.
IEEE Transactions on Biometrics, Behavior, and Identity Science.
https://doi.org/10.1109/TBIOM.2023.3298561
Zheng, S., Guo, J., Langendijk, J. A., Both, S.
, Veldhuis, R. N. J., Oudkerk, M., van Ooijen, P. M. A., Wijsman, R.
, & Sijtsema, N. M. (2023).
Survival prediction for stage I-IIIA non-small cell lung cancer using deep learning.
Radiotherapy and oncology,
180, [109483].
https://doi.org/10.1016/j.radonc.2023.109483
Bassit, A.
, Hahn, F.
, Veldhuis, R. N. J.
, & Peter, A. (2023).
Multiplication-Free Biometric Recognition for Faster Processing under Encryption. In
2022 IEEE International Joint Conference on Biometrics (IJCB) (IEEE International Joint Conference on Biometrics (IJCB); Vol. 2022). IEEE.
https://doi.org/10.1109/IJCB54206.2022.10007958
Kelly, U. M.
, Spreeuwers, L.
, & Veldhuis, R. (2023).
Exploring Face De-Identification using Latent Spaces. In
2022 IEEE International Joint Conference on Biometrics, IJCB 2022 (pp. 1-7). [10007990] (IEEE International Joint Conference on Biometrics (IJCB); Vol. 2022). IEEE.
https://doi.org/10.1109/IJCB54206.2022.10007990
Batskos, I.
, Spreeuwers, L.
, & Veldhuis, R. (2023).
Visualizing landmark based face morphing traces on digital images.
Frontiers in Computer Science,
5, [981933].
https://doi.org/10.3389/fcomp.2023.981933
Kelly, U. M.
, Spreeuwers, L.
, & Veldhuis, R. N. J. (2022).
Worst-Case Morphs: a Theoretical and a Practical Approach. In A. Bromme, N. Damer, M. Gomez-Barrero, K. Raja, C. Rathgeb, A. F. Sequeira, M. Todisco, & A. Uhl (Eds.),
2022 International Conference of the Biometrics Special Interest Group (BIOSIG) IEEE.
https://doi.org/10.1109/BIOSIG55365.2022.9896965
Atashgahi, Z.
, Mocanu, D. C.
, Veldhuis, R. N. J., & Pechenizkiy, M. (2022).
Memory-free Online Change-point Detection: A Novel Neural Network Approach. ArXiv.org.
https://arxiv.org/abs/2207.03932
Wang, S.
, Veldhuis, R.
, Brune, C.
, & Strisciuglio, N. (2022).
Frequency Shortcut Learning in Neural Networks. In
NeurIPS 2022 Workshop on Distribution Shifts: Connecting Methods and Applications
https://openreview.net/forum?id=zAfUHtSGWw
Pure Link
Vakken Collegejaar 2023/2024
Vakken in het huidig collegejaar worden toegevoegd op het moment dat zij definitief zijn in het Osiris systeem. Daarom kan het zijn dat de lijst nog niet compleet is voor het gehele collegejaar.
Vakken Collegejaar 2022/2023
Contactgegevens
Bezoekadres
Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Zilverling
(gebouwnr. 11), kamer 4074
Hallenweg 19
7522NH Enschede
Postadres
Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Zilverling
4074
Postbus 217
7500 AE Enschede