Welkom...

prof.dr.ir. R.N.J. Veldhuis (Raymond)

Hoogleraar

Expertises

Biometrics
Face Recognition
Fusion Reactions
Experiments
Classifiers
Lighting
Authentication
Cameras

Nevenactiviteiten

  • 20Face
    Adviseur 20Face
  • European Association for Biometrics
    Chairman of the Special Interest Group Academia
  • Werkgroep Informatie- en Communicatietheorie in de Benelux
    Penningmeester
  • GenKey SME producing biometric systems
    lid Scientific Advisory Board GenKey

Publicaties

Recente Artikelen
Kotzerke, J., Hao, H., Davis, S. A., Hayes, R., Spreeuwers, L. J., Veldhuis, R. N. J., & Horadam, K. J. (2016). Identification performance of evidential value estimation for ridge-based biometrics. EURASIP journal on information security, 2016(24), 1-10. DOI: 10.1186/s13635-016-0050-3
Susyanto, N., Veldhuis, R. N. J., Spreeuwers, L. J., & Klaassen, C. A. J. (2016). Two-step calibration method for multi-algorithm score-based face recognition systems by minimizing discrimination loss. 16252593. Paper presented at 9th IAPR International Conference on Biometrics, ICB 2016, Halmstad, Sweden.DOI: 10.1109/ICB.2016.7550094
Susyanto, N., Veldhuis, R. N. J., Spreeuwers, L. J., & Klaassen, C. A. J. (2016). Fixed FAR correction factor of score level fusion. 16555751. Paper presented at 2016 IEEE 8th International Conference on Biometrics Theory, Applications and Systems, BTAS 2016, Washington, United States.DOI: 10.1109/BTAS.2016.7791173
Veldhuis, R. N. J. (2015). The relation between the secrecy rate of biometric template protection and biometric recognition performance. In 2015 International Conference on Biometrics (ICB 2015): Phuket, Thailand, 19-22 May 2015 (pp. 311-318). Piscataway, NJ: IEEE. DOI: 10.1109/ICB.2015.7139055
Kotzerke, J., Kotzerke, J., Davis, S. A., Hayes, R., Spreeuwers, L. J., Veldhuis, R. N. J., & Horadam, K. J. (2015). Discriminating fingermarks with evidential value for forensic comparison. In Proceedings of the 3rd International Workshop on Biometrics and Forensics, IWBF 2015 (pp. 1-6). Piscataway, NJ, USA: IEEE. DOI: 10.1109/IWBF.2015.7110220

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Contactgegevens

Bezoekadres

Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Zilverling (gebouwnr. 11), kamer 4061
Hallenweg 19
7522NH  Enschede

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Postadres

Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Zilverling  4061
Postbus 217
7500 AE Enschede