Welkom...

prof.dr.ir. R.N.J. Veldhuis (Raymond)

Hoogleraar

Expertises

Biometrics
Authentication
Face Recognition
Classifiers
Experiments
Fusion Reactions
Communication
Biometrics
Image Quality
Pattern Recognition

Nevenactiviteiten

  • 20Face
    Adviseur 20Face
  • European Association for Biometrics
    Chairman of the Special Interest Group Academia
  • Werkgroep Informatie- en Communicatietheorie in de Benelux
    Penningmeester
  • GenKey SME producing biometric systems
    lid Scientific Advisory Board GenKey

Publicaties

Recent
Zeinstra, C., Veldhuis, R., & Spreeuwers, L. (2018). Grid-Based Likelihood Ratio Classifiers for the Comparison of Facial Marks. IEEE transactions on information forensics and security, 13(1), 253-264. [8017453]. DOI: 10.1109/TIFS.2017.2746013
Scherhag, U., Nautsch, A., Rathgeb, C., Gomez-Barrero, M., Veldhuis, R. N. J., Spreeuwers, L., ... Busch, C. (2017). Biometric Systems under Morphing Attacks: Assessment of Morphing Techniques and Vulnerability Reporting. In 2017 International Conference of the Biometrics Special Interest Group, BIOSIG 2017 [8053499] Gesellschaft für Informatik e.V.. DOI: 10.23919/BIOSIG.2017.8053499
Haasnoot, E., Verwey, W., Barnhoorn, J., Veldhuis, R., & Spreeuwers, L. J. (2017). Towards understanding behavioural biometric classifier performance over time and practice. Paper presented at 38th WIC Symposium on Information Theory in the Benelux 2017, Delft, Netherlands.
Zeinstra, C., Veldhuis, R., & Spreeuwers, L. (2017). How Random Is a Classifier Given Its Area under Curve? In A. Brömme, C. Busch, A. Dantcheva, C. Rathgeb, & A. Uhl (Eds.), 2017 International Conference of the Biometrics Special Interest Group (BIOSIG): BIOSIG 2017 [8053509] Gesellschaft für Informatik e.V.. DOI: 10.23919/BIOSIG.2017.8053509
Zeinstra, C., Veldhuis, R., Spreeuwers, L., & Ruifrok, A. (2017). Manually annotated characteristic descriptors: Measurability and variability. In 2017 5th International Workshop on Biometrics and Forensics (IWBF 2017) [7935095] Institute of Electrical and Electronics Engineers. DOI: 10.1109/IWBF.2017.7935095

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Contactgegevens

Bezoekadres

Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Zilverling (gebouwnr. 11), kamer 4067
Hallenweg 19
7522NH  Enschede

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Postadres

Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Zilverling  4067
Postbus 217
7500 AE Enschede