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prof.dr.ir. R.N.J. Veldhuis (Raymond)

Hoogleraar

Expertises

Engineering & Materials Science
Biometrics
Classifiers
Deep Learning
Face Recognition
Feature Extraction
Image Resolution
Palmprint Recognition
Medicine & Life Sciences
Deep Learning

Nevenactiviteiten

  • 20Face
    Advisor and shareholder 20Face
  • EAB European Assiociation for Biometrics
    Chair Academia SIG EAB
  • NTNU
    Professorship at another university

Publicaties

Recent
Ghafourian, M., Fierrez, J., Gomez, L. F., Vera-Rodriguez, R., Morales, A. , Rezgui, Z. , & Veldhuis, R. (2023). Toward Face Biometric De-identification using Adversarial Examples. ArXiv.org. https://doi.org/10.48550/arXiv.2302.03657
Veldhuis, R., & Raja, K. (2023). On the Relation Between ROC and CMC. IEEE Transactions on Biometrics, Behavior, and Identity Science. https://doi.org/10.1109/TBIOM.2023.3298561
Zheng, S., Guo, J., Langendijk, J. A., Both, S. , Veldhuis, R. N. J., Oudkerk, M., van Ooijen, P. M. A., Wijsman, R. , & Sijtsema, N. M. (2023). Survival prediction for stage I-IIIA non-small cell lung cancer using deep learning. Radiotherapy and oncology, 180, [109483]. https://doi.org/10.1016/j.radonc.2023.109483
Bassit, A. , Hahn, F. , Veldhuis, R. N. J. , & Peter, A. (2023). Multiplication-Free Biometric Recognition for Faster Processing under Encryption. In 2022 IEEE International Joint Conference on Biometrics (IJCB) (IEEE International Joint Conference on Biometrics (IJCB); Vol. 2022). IEEE. https://doi.org/10.1109/IJCB54206.2022.10007958
Kelly, U. M. , Spreeuwers, L. , & Veldhuis, R. (2023). Exploring Face De-Identification using Latent Spaces. In 2022 IEEE International Joint Conference on Biometrics, IJCB 2022 (pp. 1-7). [10007990] (IEEE International Joint Conference on Biometrics (IJCB); Vol. 2022). IEEE. https://doi.org/10.1109/IJCB54206.2022.10007990
Kelly, U. M. , Spreeuwers, L. , & Veldhuis, R. N. J. (2022). Worst-Case Morphs: a Theoretical and a Practical Approach. In A. Bromme, N. Damer, M. Gomez-Barrero, K. Raja, C. Rathgeb, A. F. Sequeira, M. Todisco, & A. Uhl (Eds.), 2022 International Conference of the Biometrics Special Interest Group (BIOSIG) IEEE. https://doi.org/10.1109/BIOSIG55365.2022.9896965
Wang, S. , Veldhuis, R. , Brune, C. , & Strisciuglio, N. (2022). Frequency Shortcut Learning in Neural Networks. In NeurIPS 2022 Workshop on Distribution Shifts: Connecting Methods and Applications https://openreview.net/forum?id=zAfUHtSGWw

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Contactgegevens

Bezoekadres

Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Zilverling (gebouwnr. 11), kamer 4074
Hallenweg 19
7522NH  Enschede

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Postadres

Universiteit Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Zilverling  4074
Postbus 217
7500 AE Enschede