Expertises
Biometrics
Authentication
Face Recognition
Classifiers
Experiments
Fusion Reactions
Communication
Biometrics
Image Quality
Pattern Recognition
Verbonden aan
Nevenactiviteiten
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20Face
Adviseur 20Face -
European Association for Biometrics
Chairman of the Special Interest Group Academia -
Werkgroep Informatie- en Communicatietheorie in de Benelux
Penningmeester -
GenKey SME producing biometric systems
lid Scientific Advisory Board GenKey
Publicaties
Recent
Zeinstra, C., Veldhuis, R., & Spreeuwers, L. (2018). Grid-Based Likelihood Ratio Classifiers for the Comparison of Facial Marks. IEEE transactions on information forensics and security, 13(1), 253-264. [8017453]. DOI: 10.1109/TIFS.2017.2746013
Zeinstra, C. G., Meuwly, D., Ruifrok, A. C., Veldhuis, R. N., & Spreeuwers, L. J. (2018). Forensic face recognition as a means to determine strength of evidence: A survey. Forensic Science Review, 30(1), 21-32.
Veldhuis, R. N. J. (2018). Gezichtsherkenning op lage resolutie: Toepassingen camerasurveillance. Security management, 4, 19-21. [4].
Zeinstra, C., Veldhuis, R., & Spreeuwers, L. (2017). How Random Is a Classifier Given Its Area under Curve? In A. Brömme, C. Busch, A. Dantcheva, C. Rathgeb, & A. Uhl (Eds.), 2017 International Conference of the Biometrics Special Interest Group (BIOSIG): BIOSIG 2017 [8053509] Gesellschaft fur Informatik (GI). DOI: 10.23919/BIOSIG.2017.8053509
Zeinstra, C. G., Veldhuis, R. N. J., Spreeuwers, L. J., Ruifrok, A. C. C., & Meuwly, D. (2017). ForenFace: A unique annotated forensic facial image dataset and toolset. IET biometrics, 6(6), 487-494. DOI: 10.1049/iet-bmt.2016.0160
Zeinstra, C., Veldhuis, R., Spreeuwers, L., & Ruifrok, A. (2017). Manually annotated characteristic descriptors: Measurability and variability. In 2017 5th International Workshop on Biometrics and Forensics (IWBF 2017) [7935095] Institute of Electrical and Electronics Engineers. DOI: 10.1109/IWBF.2017.7935095
van Dam, C., Veldhuis, R. N. J., & Spreeuwers, L. J. (2016). Face reconstruction from image sequences for forensic face comparison. IET biometrics, 5(2), 140-146. DOI: 10.1049/iet-bmt.2015.0036
Kotzerke, J., Hao, H., Davis, S. A., Hayes, R., Spreeuwers, L. J., Veldhuis, R. N. J., & Horadam, K. J. (2016). Identification performance of evidential value estimation for ridge-based biometrics. EURASIP journal on information security, 2016(24), 1-10. DOI: 10.1186/s13635-016-0050-3
Susyanto, N., Veldhuis, R. N. J., Spreeuwers, L. J., & Klaassen, C. A. J. (2016). Two-step calibration method for multi-algorithm score-based face recognition systems by minimizing discrimination loss. 16252593. Paper presented at 9th IAPR International Conference on Biometrics, ICB 2016, Halmstad, Sweden.DOI: 10.1109/ICB.2016.7550094
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Bezoekadres
Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Zilverling
(gebouwnr. 11), kamer 4067
Hallenweg 19
7522NH Enschede
Postadres
Universiteit Twente
Faculteit Elektrotechniek, Wiskunde en Informatica
Zilverling
4067
Postbus 217
7500 AE Enschede