Expertises
Material Science
- Thin Films
- Reflectivity
- Surface
- Temperature
Chemistry
- Liquid Film
Physics
- Growth
- Mirrors
- Diffusivity
Organisaties
Publicaties
2026
Using Monte Carlo-based Uncertainty Quantification for Free-Form XRR (2026)[Contribution to conference › Poster] NWO Physics 2026. Lokhorst, H. W., van de Kruijs, R. W. E., Makhotkin, I. A., Schlottbom, M. & Ackermann, M.
2025
Hume-Rothery driven oxidation resilience of binary alloy thin films (2025)Journal of Applied Physics, 138(23). Article 235301. Homsma, M. D., Van den Beld, W. T. E., Van de Kruijs, R. W. E. & Ackermann, M. D.https://doi.org/10.1063/5.0293334EUV spectrum of high power LPP source (2025)In International Conference on Extreme Ultraviolet Lithography 2025. Article 1368611 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 13686). SPIE. van de Kerkhof, M., van der Horst, R., Bayraktar, M., van de Kruijs, R., Osorio, E. & Ackermann, M.https://doi.org/10.1117/12.3072173Using Monte Carlo-based Uncertainty Quantification for Free-Form XRR (2025)[Contribution to conference › Poster] 8th PTB-Seminar on VUV and EUV Metrology 2025. Lokhorst, H. W., van de Kruijs, R. W. E., Makhotkin, I. A., Schlottbom, M. & Ackermann, M.Film thickness non-uniformity and crucial role of water dosage for atomic layer deposition of yttrium oxide from yttrium cyclopentadienyl precursor (2025)[Contribution to conference › Poster] 24th EUROCVD & ALD 2025. Wu, W., van de Kruijs, R. W. E. & Kovalgin, A. Y.Using Monte Carlo-based methods for Uncertainty Quantification for XRR (2025)[Contribution to conference › Poster] International Workshop on X-Ray and Neutron Multilayer Structures, PXRNMS 2025. Lokhorst, H. W., van de Kruijs, R. W. E., Makhotkin, I. A., Schlottbom, M. & Ackermann, M.A Universal Model for Hydrogen−Induced Reduction of Transition Metal Compounds (2025)[Thesis › PhD Thesis - Research UT, graduation UT]. University of Twente. Rehman, A.https://doi.org/10.3990/1.9789036565288Engineering Work Function to Stabilize Metal Oxides in Reactive Hydrogen (2025)The journal of physical chemistry letters, 16(10), 2592-2598. Rehman, A., van de Kruijs, R. W. E., van den Beld, W. T. E., Sturm, J. M. & Ackermann, M.https://doi.org/10.1021/acs.jpclett.4c03404Relation between electronic structure and emissivity of MoSi2-based thin membranes for radiative cooling (2025)Journal of alloys and compounds, 1018. Article 179277. Baskakov, A., van de Kruijs, R. W. E., Houweling, S., Colombi, G., Akhmetov, F., Sturm, J. M. & Ackermann, M.https://doi.org/10.1016/j.jallcom.2025.179277Corrigendum to “Structural pathways for ultrafast melting of optically excited thin polycrystalline Palladium films” [Acta Materialia, 276 (2024) 120043] (Acta Materialia (2024) 276, (S1359645424003951), (10.1016/j.actamat.2024.120043)) (2025)Acta materialia, 282. Article 120443. Antonowicz, J., Olczak, A., Sokolowski-Tinten, K., Zalden, P., Milov, I., Dzięgielewski, P., Bressler, C., Chapman, H. N., Chojnacki, M., Dłużewski, P., Rodriguez-Fernandez, A., Fronc, K., Gawełda, W., Georgarakis, K., Greer, A. L., Jacyna, I., van de Kruijs, R. W. E., Kamiński, R., Khakhulin, D., … Sobierajski, R.https://doi.org/10.1016/j.actamat.2024.120443
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Vakken collegejaar 2025/2026
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Vakken collegejaar 2024/2025
Adres
Universiteit Twente
Carré (gebouwnr. 15), kamer C2017
Hallenweg 23
7522 NH Enschede
Universiteit Twente
Carré C2017
Postbus 217
7500 AE Enschede
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