dr.ir. R.W.E. van de Kruijs (Robbert)

Physics & Astronomy

# Grazing Incidence
# Laminates
# Mirrors
# Reflectance
# Thin Films
# X Rays

Engineering & Materials Science

# Multilayers

Chemistry

# Multilayer

Faculty of Science and Technology (TNW), XUV Optics (XUV)

Homsma, M. , van den Beld, W. , van de Kruijs, R. W. E. , & Ackermann, M. (2024). Oxidation of thin film binary entropy alloys. Poster session presented at NWO Physics 2024, Veldhoven, Netherlands.

Baskakov, A., Golsanamlou, Z. , van de Kruijs, R. W. E. , Bokdam, M. , Sturm, J. M. , & Ackermann, M. (2023). Infrared emissivity of thin films based on molybdenum silicides with silicon. Poster session presented at MESA+ Meeting 2023, Enschede, Netherlands.

Rehman, A. , Kruijs, R. W. E. V. D. , Beld, W. T. E. V. D. , Sturm, J. M. , & Ackermann, M. (2023). Chemical Interaction of Hydrogen Radicals (H*) with Transition Metal Nitrides. The Journal of physical chemistry C, 127(36), 17770-17780. https://doi.org/10.1021/acs.jpcc.3c04490

Chen, J. , Louis, E., Harmsen, R. , Tsarfati, T. , Wormeester, H., van Kampen, M., van Schaik, W. , van de Kruijs, R. , & Bijkerk, F. (2023). Corrigendum to “In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers” [Appl. Surf. Sci. 258(1) (2011) 7–12]. Applied surface science, 618, Article 155765. https://doi.org/10.1016/j.apsusc.2022.155765

Ciesielski, R., Saadeh, Q., Philipsen, V., Opsomer, K., Soulié, J. P., Wu, M., Naujok, P. , van de Kruijs, R. W. E., Detavernier, C., Kolbe, M., Scholze, F., & Soltwisch, V. (2022). Determination of optical constants of thin films in the EUV. Applied Optics, 61(8), 2060-2078. https://doi.org/10.1364/AO.447152

Chandrasekaran, A. (2022). Surface and interface diffusion processes in nanoscale thin films. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente. https://doi.org/10.3990/1.9789036554763

Shafikov, A. (2022). Fracture behavior and characterization of free-standing metal silicide thin films. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente. https://doi.org/10.3990/1.9789036554251

Sturm, J. M. , van de Kruijs, R. W. E. , Phadke, P. , & Ackermann, M. (2022). LEIS analysis of thin Cu films on Ru: an unexpected result on sputter intermixing. Poster session presented at LEIS Workshop 2022, Brno.

Schurink, B. , van den Beld, W. , Tiggelaar, R. M. , van de Kruijs, R. W. E. , & Bijkerk, F. (2022). Synthesis and Characterization of Boron Thin Films Using Chemical and Physical Vapor Depositions. Coatings, 12 (5), Article 685. https://doi.org/10.3390/coatings12050685

Phadke, P. , Zameshin, A. A. , Sturm, J. M. , van de Kruijs, R. W. E. , & Bijkerk, F. (2022). Sputter yields of monoatomic solids by Ar and Ne ions near the threshold: A Bayesian analysis of the Yamamura Model. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 520, 29-39. https://doi.org/10.1016/j.nimb.2022.03.016

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